Publisher: Pleiades Publishing, Ltd.
ISSN PRINT: 1054-6618
ISSN ONLINE: 1555-6212
Authors will have the option to choose how their article is published.
Traditional publishing model: published articles are made available to institutions and individuals who subscribe to this journal or who pay to read specific articles. There is no charge to publish.
Open Access (OA) model: published articles are freely and permanently available online. Anyone, anywhere can read and build upon this research. If you would be interested in publishing Open Access in this journal please follow the link.
Pattern Recognition and Image Analysis is an international peer-reviewed journal that publish the results of fundamental and applied scientific research in the field of image processing, recognition, analysis and understanding, pattern recognition, artificial intelligence, and related fields of theoretical and applied computer science and applied mathematics. The policy of the journal provides for the rapid publication of original scientific articles, analytical reviews, articles of the world's leading scientists and specialists on the subject of the journal solicited by the editorial board, special thematic issues, proceedings of the world's leading scientific conferences and seminars, as well as short reports containing new results of fundamental and applied research in the field of mathematical theory and methodology of image analysis, mathematical theory and methodology of image recognition, and mathematical foundations and methodology of artificial intelligence. The journal also publishes articles on the use of the apparatus and methods of the mathematical theory of image analysis and the mathematical theory of image recognition for the development of new information technologies and their supporting software and algorithmic complexes and systems for solving complex and particularly important applied problems. The main scientific areas are the mathematical theory of image analysis and the mathematical theory of pattern recognition. The journal also embraces the problems of analyzing and evaluating poorly formalized, poorly structured, incomplete, contradictory and noisy information, including artificial intelligence, bioinformatics, medical informatics, data mining, big data analysis, machine vision, data representation and modeling, data and knowledge extraction from images, machine learning, forecasting, machine graphics, databases, knowledge bases, medical and technical diagnostics, neural networks, specialized software, specialized computational architectures for information analysis and evaluation, linguistic, psychological, psychophysical, and physiological aspects of image analysis and pattern recognition, applied problems, and related problems. Pattern Recognition and Image Analysis is a hybrid journal that publishes mostly subscription articles that are free of charge for the authors, but also accepts Open Access articles with article processing charges. The journal is one of the top ten global periodicals on image analysis and pattern recognition and is the only publication on this topic in Central and Eastern Europe. The journal welcomes manuscripts from all countries.
1) scientists, specialists, teachers of general education and technical universities, engineers, developers of information technologies and software and algorithmic complexes and systems, postgraduates and undergraduates specializing in:
a) image analysis and pattern recognition;
b) computer science and applied mathematics.
2) scientists, specialists, teachers of general education and technical universities, engineers, developers of information technologies and software and algorithmic complexes and systems, postgraduates and undergraduates of various specialties who are faced with the tasks of analyzing and evaluating poorly formalized, poorly structured, incomplete, contradictory and noisy information, including applied problems of image recognition and analysis.
ACM Digital Library, Baidu, CLOCKSS, CNKI, CNPIEC, Dimensions, EBSCO Discovery Service, EI Compendex, Emerging Sources Citation Index, Google Scholar, INSPEC, Japanese Science and Technology Agency (JST), Naver, OCLC WorldCat Discovery Service, Portico, ProQuest ABI/INFORM, ProQuest Advanced Technologies & Aerospace Database, ProQuest-ExLibris Primo, ProQuest-ExLibris Summon, Russian Science Citation Index, SCImago, SCOPUS, TD Net Discovery Service, UGC-CARE List (India), WTI AG, Wanfang
Queries about submission issues, peer review process, or the status of your manuscript should be sent to the Editorial Office of Pattern Recognition and Image Analysis: email@example.com
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