Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques

Publisher: Pleiades Publishing, Ltd.

ABOUT THIS JOURNAL

Journal Metrics

Usage
  • 9060Downloads 2018
    Springer measures the usage on the SpringerLink platform according to the COUNTER (Counting Online Usage of NeTworked Electronic Resources) standards.
  • 16 Usage Factor 2017/2018
    The Springer Journal Usage Factor 2017/18 was calculated as suggested by the COUNTER Code of Practice for Usage Factors. It is the median value of the number of downloads in 2017/18 for all articles published online in that particular journal during the same time period. The Usage Factor calculation is based on COUNTER-compliant usage data on the SpringerLink platform. (Counting Online Usage of NeTworked Electronic Resources) standards.

Impact
  • 0.57Source Normalized Impact per Paper (SNIP) 2018
    Source Normalized Impact per Paper (SNIP) measures contextual citation impact by weighting citations based on the total number of citations in a subject field. The impact of a single citation is given higher value in subject areas where citations are less likely, and vice versa.
  • Q3Quartile: Surfaces, Coatings and Films 2018
    The set of journals have been ranked according to their SJR and divided into four equal groups, four quartiles. Q1 (green) comprises the quarter of the journals with the highest values, Q2 (yellow) the second highest values, Q3 (orange) the third highest values and Q4 (red) the lowest values.
  • 0.24 SCImago Journal Rank (SJR) 2018
    SCImago Journal Rank (SJR) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.
  • 16H-Index 2018
    A journal has an H index of h if it published h papers each of which has been cited in other journals at least h times. Calculations are based on Scopus.

SCOPE

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques  publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.

ABSTRACTING & INDEXING

Chemical Abstracts Service (CAS), EBSCO Discovery Service, EI Compendex, Emerging Sources Citation Index, Gale, Gale Academic OneFile, Google Scholar, INIS Atomindex, INSPEC, Institute of Scientific and Technical Information of China, Japanese Science and Technology Agency (JST), Naver, OCLC WorldCat Discovery Service, ProQuest Advanced Technologies & Aerospace Database, ProQuest Central, ProQuest Materials Science and Engineering Database, ProQuest SciTech Premium Collection, ProQuest Technology Collection, ProQuest-ExLibris Primo, ProQuest-ExLibris Summon, SCImago, SCOPUS, Semantic Scholar.

CONTACTS

Poverkhnost'. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya
Profsoyuznaya ul. 90, Moscow, 117997 Russia
Phone: +7 (499) 743-00-32
E-mail: surf@crys.ras.ru
Web-site: http://www.issp.ac.ru/journal/surface/