Optoelectronics, Instrumentation and Data Processing

Publisher: Allerton Press, Inc.

ISSN PRINT: 8756-6990
ISSN ONLINE: 1934-7944

ABOUT THIS JOURNAL

Publishing model: Hybrid

Authors will have the option to choose how their article is published.

Traditional publishing model: published articles are made available to institutions and individuals who subscribe to this journal or who pay to read specific articles. There is no charge to publish.

Open Access (OA) model: published articles are freely and permanently available online. Anyone, anywhere can read and build upon this research. If you would be interested in publishing Open Access in this journal please follow the link.

Journal Metrics

USAGE
  • 10582Downloads 2023
    Springer measures the usage on the SpringerLink platform according to the COUNTER (Counting Online Usage of NeTworked Electronic Resources) standards.
  • 37 Usage Factor 2022/2023
    The Springer Journal Usage Factor 2022/2023 was calculated as suggested by the COUNTER Code of Practice for Usage Factors. It is the median value of the number of downloads in 2022/2023 for all articles published online in that particular journal during the same time period. The Usage Factor calculation is based on COUNTER-compliant usage data on the SpringerLink platform. (Counting Online Usage of NeTworked Electronic Resources) standards.

WEB OF SCIENCE
  • 0.5 Impact Factor 2023
    The journal Impact Factor is the average number of times articles from the journal published in the past two years have been cited in the JCR year. It is calculated by dividing the number of citations in the JCR year by the total number of articles published in the two previous years.
  • 0.5 5 year Impact Factor 2023
    The 5-year journal Impact Factor is the average number of times articles from the journal published in the past five years have been cited in the JCR year. It is calculated by dividing the number of citations in the JCR year by the total number of articles published in the five previous years.
  • 0.12 Journal Citation Indicator (Physics, Multidisciplinary) 2023
    The Journal Citation Indicator is a measure of the average Category Normalized Citation Impact (CNCI) of citable items (articles & reviews) published by a journal over a recent three year period. It is used to help you evaluate journals based on other metrics besides the Journal Impact Factor (JIF).

SCOPUS
  • 1.0 CiteScore 2023
    CiteScore acts as an indicator of the citation level of peer-reviewed materials, which is calculated as the ratio of the average number of citations to the number of published documents. Therewith, the publication window is equal to four years.
  • 0.55Source Normalized Impact per Paper (SNIP) 2023
    Source Normalized Impact per Paper (SNIP) measures contextual citation impact by weighting citations based on the total number of citations in a subject field. The impact of a single citation is given higher value in subject areas where citations are less likely, and vice versa.
  • 0.206 SCImago Journal Rank (SJR) 2023
    SCImago Journal Rank (SJR) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.
  • Q4Quartile: Electrical and Electronic Engineering 2023
    The set of journals have been ranked according to their SJR and divided into four equal groups, four quartiles. Q1 (green) comprises the quarter of the journals with the highest values, Q2 (yellow) the second highest values, Q3 (orange) the third highest values and Q4 (red) the lowest values.
  • 14H-Index 2023
    A journal has an H index of h if it published h papers each of which has been cited in other journals at least h times. Calculations are based on Scopus.

SCOPE

Optoelectronics, Instrumentation and Data Processing  is a peer-reviewed journal that focuses on the following areas: analysis and synthesis of signals and images; automated measurement systems; computational and information-measuring systems; physical and technical foundations of micro- and optoelectronics; optical information technologies; modeling in physical and technical research; and nanotechnologies in optics and electronics. The journal reports findings in several growing areas of physical and computer research. From its inception, it has covered the design and development of instrumentation and systems for automatic measurement. Its scope has broadened to include automation based on laser and optoelectronic technologies, laser and nonlinear optics, new information technologies, and problem-oriented computer systems. The journal timely presents the results of basic and applied research on solid-state physics, optics, and holography in applications to computers and measurement techniques; physical aspects of micro- and optoelectronics; optical information technologies, systems and components; laser physics applications; automated measurement systems; automation of scientific R&D and industrial automation; real-time image analysis and synthesis systems; AI methods and systems in scientific research and management; computer networks and data transmission systems; computer-aided VLSI design, and other topics. Previously focused on translation, the journal now has the aim to become an international publication and accepts manuscripts originally submitted in English from all countries, along with translated works. The peer review policy of the journal is independent of the manuscript source, ensuring a fair and unbiased evaluation process for all submissions.

READERSHIP

The journal is addressed to scientists, aspirants, engineers and students who are interested in the results of fundamental and applied researches in such areas as IT on the basis of current achievements of Physics, Photochemistry, Materials Science, Informatics and Computer technologies.

ABSTRACTING & INDEXING

Astrophysics Data System (ADS), Baidu, CLOCKSS, CNKI, CNPIEC, Dimensions, EBSCO Discovery Service, EI Compendex, Emerging Sources Citation Index, Google Scholar, INIS Atomindex, INSPEC, Japanese Science and Technology Agency (JST), Naver, OCLC WorldCat Discovery Service, Portico, ProQuest-ExLibris Primo, ProQuest-ExLibris Summon, SCImago, SCOPUS, TD Net Discovery Service, UGC-CARE List (India), Wanfang

Contact the journal

Queries about submission issues, peer review process, or the status of your manuscript should be sent to the Editorial Office of Optoelectronics, Instrumentation and Data Processing: optelins@pleiadesonline.com