Vol. 11, No. 5, 2017
A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques ISSN 1027-4510.
Small-Angle Neutron Scattering at Fractal Objects
p. 897 abstract
Mössbauer Study of Products from the Arc Synthesis of Fe-Carbon Nanoclusters
p. 908 abstract
Investigation of the Radiation-Protective Properties of a Highly Filled Liquid Glass Material
p. 912 abstract
Features of Changes in the Surface Structure of K-208 Glass Under Electron—Proton Irradiation
p. 917 abstract
Radiation Resistance of 4H-SiC Schottky Diodes under Irradiation with 0.9-MeV Electrons
p. 924 abstract
Study of the Combined Carbonization of Poly(Vinylidene Fluoride) by X-Ray Photoelectron Spectroscopy
p. 927 abstract
Structural Phase States and Properties of the Layer Surfaced on Low-Carbon Steel with Fe‒C‒Cr‒Nb‒W Powder-Core Wire Followed by Electron-Beam Processing
p. 933 abstract
Polyaniline-Containing Composites Based on Highly Porous Carbon Cloth for Flexible Supercapacitor Electrodes
p. 940 abstract
Effect of Gamma Radiation on the Surface and Bulk Properties of Poly(tetrafluoroethylene)
p. 948 abstract
Study of the Morphology and Structure of Porous Composites Obtained from Na–CMC Suspensions with Aluminum Micro-Particles and Boehmite Nanoparticles
p. 955 abstract
Short-Range Order of TlIn1 – xSnxTe2 Thin Films
p. 960 abstract
Influence of Elastic-Scattering Processes on an X-Ray Photoelectron Spectroscopy Signal: Effect of the Underlying Surface
p. 963 abstract
Anomalous Asymmetry of Carbon Nanopillar Growth on Both Sides of a Thin Substrate Irradiated with a Focused Electron Beam
p. 969 abstract
Spontaneous Polarization of Finely Disperse Dielectrics with Surface Donor Centers
p. 973 abstract
On the Possibility of Using the Galerkin Projection Method to Model the Spatial Distribution of Minority Charge Carriers Generated by an Electron Probe in a Semiconductor
p. 981 abstract
Experimental and Simulation Investigations of the Peculiarities of Relativistic Electron Beam Scattering at a Small Angle of Incidence on a Thin Flat Target
p. 987 abstract
Method for Additional Purification of the Surface of Si(111) Single Crystal
p. 994 abstract
Neutron-Beam Former for the REVERANS Reflectometer with a Vertical Scattering Plane
p. 1000 abstract
Power Loss to Generating Ion Current in Radio-Frequency Ion Thrusters and Technological Sources of Ions
p. 1008 abstract
Evolution of Surface Morphology during the Growth of Amorphous and Polycrystalline Silicon Films
p. 1014 abstract
Analysis of the Surface Morphology, Structure and Properties of Polyamidoimide Nanocomposites with Tubular Hydrosilicates
p. 1022 abstract
Profile, Morphology and Surface Elemental Composition of Through Micro-Holes in Silicon Wafers
p. 1033 abstract
TEM Study of the Microstructure of Melt Grown FeGe2 Single Crystals
p. 1039 abstract
Polytherms of the Wetting Angles of Zinc and Serbian Bronze on Tungsten–Cobalt Hard Alloys
p. 1042 abstract
Investigation of the Local Characteristics of Amorphous Electrical Steel
p. 1046 abstract
Structure and Properties of a Low-Carbon Steel Surface Modified by Electric Arc Surfacing
p. 1050 abstract
Energy Spectrum of Electrons Transmitted through Curved Dielectric Tubes
p. 1056 abstract
Comparative Analysis of Methods for Measurement of the Surface Potential of Dielectrics Charging Under Electron-Beam Irradiation in a Scanning Electron Microscope
p. 1062 abstract
Emission Theory of Amorphous-Material Sputtering. Energy Dependence of the Sputtering Coefficient
p. 1069 abstract
Synergetics of Surface Sputtering by Polyatomic Ions
p. 1078 abstract
Evolution of the Stimulated Resonance of a Channeling Electron Beam
p. 1082 abstract
Investigation of Crystal Imperfections with Multiple X-Ray Interferometers
p. 1089 abstract
On the Possibility of Applying the Bers Apparatus to Modeling the Processes of Heat and Mass Transfer Caused by Electrons in a Planar Multilayer Medium
p. 1096 abstract
HPHT Single Crystal Diamond Type IIB Growth Sector Influence on the Secondary Electron Emission Phenomenon
p. 1101 abstract