Contents
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Vol. 5, No. 5, 2011
A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques ISSN 1027-4510.
Mikhail Valentinovich Kovalchuk On His 65th Birthday p. 813
Spectral-Selective X-ray Methods for Structure Diagnostics of Ordered Bioorganic
Nanosystems on a Liquid Surface
N. N. Novikova, M. V. Kovalchuk, N. D. Stepina, O. V. Konovalov,
E. A. Yurieva, and E. S. Chukhray p. 816 abstract
Coplanar Three-Beam X-ray Diffraction Study in TeO2 Single Crystal
Using Synchrotron Radiation
A. E. Blagov, M. V. Kovalchuk, V. G. Kohn, E. Kh. Mukhamedzhanov,
Yu. V. Pisarevsky, and P. A. Prosekov p. 822 abstract
Synchrotron and Neutron-Scattering Methods for Studies of Properties
of Condensed Matter: Competition or Complementarity?
A. V. Belushkin, D. P. Kozlenko, and A. V. Rogachev p. 828 abstract
The Microstructure of Vertically Coupled Quantum Dots Ensembles by EXAFS Spectroscopy
S. B. Erenburg, S. V. Trubina, N. V. Bausk, A. I. Nikiforov, A. V. Dvurechenskii,
V. G. Mansurov, K. S. Zhuravlev, and S. G. Nikitenko p. 856 abstract
Study of Physicochemical and Biological Properties of Calcium Phosphate Coatings
Prepared by RF Magnetron Sputtering of Silicon-Substituted Hydroxyapatite
V. F. Pichugin, M. A. Surmeneva, R. A. Surmenev, I. A. Khlusov, and M. Epple p. 863 abstract
Simulation of Growth of Silicon Nanowhiskers with GeSi Heterojunctions
A. G. Nastovjak, I. G. Neizvestny, and N. L. Shwartz p. 870 abstract
Connection of Gibbs Layer Gatherings with Rate of Mass Transfer upon Deposition
of Thin Films with Presence of Impurity
A. A. Bochkarev and V. I. Polyakova p. 878 abstract
On the Theory of X-Ray Coherent Reflection from a Rough Surface
S. V. Salikhov, F. N. Chukhovskii, and A. M. Polyakov p. 887 abstract
Application of a Focused Ion Beam to Prepare Electron Microscopy Samples
of Surface Nanostructures
R. L. Volkov, N. I. Borgardt, V. N. Kukin, A. S. Prikhodko, A. S. Basaev, and Yu. P. Shaman p. 900 abstract
Study of Nanostructures on a Solar Cell Surface Exposed on the Mir Orbital Station
N. N. Myagkov, Kh. Kh. Valiev, Yu. G. Yanovskii, Yu. V. Kornev,
O. B. Yumashev, and V. N. Rebrikov p. 905 abstract
Radiation Effect on the Electrophysical Properties of Some Oxide Dielectric Materials
I. Kh. Abdykadyrova p. 911 abstract
Imaging of a Test Object with a Trapezoidal Profile and Large Side Wall Inclinations
in a Scanning Electron Microscope in the Backscattered Electron Mode
Yu. A. Novikov p. 917 abstract
Revelation of the Microstructure of Oxide FeAl/Al2O3 Nanocomposite
T. Yu. Kiseleva, A. O. Polyakov, A. A. Novakova, and N. N. Sysoev p. 924 abstract
Studies of Structure and Composition of a Pt-Based Basic Electrode for Deposition
of PZT Ferroelectric Films on Silicon Substrates
V. G. Beshenkov, A. G. Znamenskii, and V. A. Marchenko p. 930 abstract
Electron Probe Microanalysis of HgCdTe Heteroepitaxial Structures with CdTe Buffer Layers
S. A. Dvoretskii, Yu. N. Dolganin, V. V. Karpov, N. N. Mikhailov, N. N. Mikheev,
A. A. Mukhanova, A. N. Polyakov, and M. A. Stepovich p. 934 abstract
Optical Properties of 1D Metal Nanogratings
I. A. Chernykh, D. A. Mamichev, Yu. V. Grishchenko, V. V. Roddatis, M. L. Zanaveskin,
M. R. Shcherbakov, A. A. Fedyanin, E. G. Novoselova, I. S. Smirnov, and A. N. Marchenkov p.941 abstract
Study of the Effect of Irradiation with the SEM Electron Beam on Cathodoluminescence
and the Induced Current in InGaN/GaN Structures with Multiple Quantum Wells
P. S. Vergeles, N. M. Shmidt, and E. B. Yakimov p. 945 abstract
Study of Solar Silicon Multicrystals by SEM and EPMA Methods
L. A. Pavlova, A. I. Nepomnyashchikh, and S. M. Peshcherova p. 949 abstract
SEM Investigation of the Electrical Properties of Silicon Ribbons
S. K. Brantov, O. V. Feklisova, and E. B. Yakimov p. 954 abstract
Synchrotron Investigations of Electronic and Atomic-Structure Peculiarities
for Silicon-Oxide Films Surface Layers Containing Silicon Nanocrystals
V. A. Terekhov, S. Yu. Turishchev, K. N. Pankov, I. E. Zanin, E. P. Domashevskaya,
D. I. Tetelbaum, A. N. Mikhailov, A. I. Belov, and D. E. Nikolichev p. 958 abstract
Thermostimulated Surface Autosegregation in the Bismuth Ferrite Single Crystals
Yu. Ya. Tomashpolsky and N. V. Sadovskaya p. 968 abstract
Formation of Surface Gradient Structural-Phase States under Electron-Beam Treatment
of Stainless Steel
V. E. Gromov, S. V. Gorbunov, Yu. F. Ivanov, S. V. Vorobiev, and S. V. Konovalov p. 974 abstract
Mutual Electrosurface Transfer and Phase Formation at the MeWO4 | WO3
(Me = Ca, Sr, Ba) Interface: Electron Microscopy Data
A. Ya. Neiman, E. V. Tsipis, V. Yu. Kolosov, N. N. Pestereva, E. A. Elizarova,
P. Chapon, and M. Yu. Nekhin p. 979 abstract
Microstructure and Properties of Single-Crystal Rare-Earth Oxide Fibers
V. V. Voronov, L. D. Iskhakova, V. V. Kashin, S. Ya. Rusanov, and V. B. Tsvetkov p. 986 abstract
Technique for Investigating the Spatial Structure of Thin Films at a Nanolevel
N. V. Egorov, A. G. Karpov, L. I. Antonova, A. G. Fedorov, V. V. Trofimov, and S. R. Antonov p. 992 abstract
Study of Phase Transformations in the Si67Fe33 Thin-Film System
upon Steady-State Annealing
A. N. Malyshko, A. M. Chaplanov, and E. N. Shcherbakova p. 996 abstract
Effect of Drying Temperature on Sizes and Morphology of Goethite Nanoparticles
A. A. Novakova, A. R. Savilov, I. I. Puzik, V. V. Levina, N. N. Sysoev, and A. A. Kornilova p. 1001 abstract
Chemical Composition and Surface Morphology of Anodic Alumina Determined
by Electron Microscopy and Thermogravimetry
I. V. Gasenkova, N. I. Mazurenko, and E. V. Ostapenko p. 1005 abstract
Grain Structure and Texture of Rapidly Solidified Foils of Tin and Its Alloys
O. V. Gusakova and V. G. Shepelevich p. 1011 abstract
Application of Fourier Analysis of Scanning Electron Microscopy Images
for Studying Variation Features of Reservoir Properties of Carbonate Rocks
at Stages of Catagenetic Transformations
V. A. Kuzmin and N. A. Skibitskaya p. 1016 abstract
Errata
Erratum: Calculation of the Electronic Structure of Metal Island Films
[Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques 4, 672 (2011)]
E. R. Amanbaev, E. Yu. Zykova, A. A. Klavsyuk, T. N. Polivnikova,
A. A. Khaidarov, and A. L. Klavsyuk p.1021
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