Contents
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques

Vol. 4, No. 5, 2010

A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques ISSN 1027-4510.

Features of the Formation of a Perovskite Phase in Thin Polycrystalline Pb(Zr,Ti)O₃ Films

V. P. Pronin, S. V. Senkevich, E. Yu. Kaptelov, and I. P. Pronin p. 703  abstract

Comparison of Extended-Defect Contrasts Calculated in the XBIC and EBIC Methods

E. B. Yakimov p. 709  abstract

AFM Investigation of Films Based on UV-Solidified Powder
Oligoesterdimethacrylate Compositions

Yu. V. Kotova, T. E. Sukhanova, M. E. Vylegzhanina, A. I. Grigoriev, L. M. Egorova,
N. A. Egorova, N. G. Kuzina, and L. N. Mashlyakovsky p. 712  abstract

Fabrication of Specified-Geometry Metal Pattern by Proton Irradiation
through a Single-Layer Mask

B. A. Gurovich, A. G. Domantovskii, and K. I. Maslakov p. 722  abstract

Evolution of the Phase-Structure State during Annealing of Fe–ZrN Films Grown
by Magnetron Sputtering

O. M. Zhigalina, D. N. Khmelenin, E. N. Sheftel, G. Sh. Usmanova, and M. Inoue p. 727  abstract

Development of the Method of Electron–Optical in Situ Monitoring
for Periodic Structures

M. Yu. Barabanenkov, V. V. Kazmiruk, and T. N. Savitskaya p. 733  abstract

Periodic Domain Structures Obtained by Growth of LiNbO₃Crystals
Doped with Gadolinium

L. S. Kokhanchik, M. N. Palatnikov, and O. B. Scherbina p. 740  abstract

Electron Microscopy Investigation of AlMg6 Aluminum Alloy Surface Defects
Caused by Microorganisms Extracted in Space Stations

T. A. Alekhova, V. Ya. Shklover, N. A. Zagustina, N. V. Shvyndina,
A. D. Plotnikov, and A. L. Vasil’ev p. 747  abstract

Investigations of Electron Beam Induced Conductivity in Silicon Oxide Thin Films

S. S. Borisov, P. S. Vergeles, and E. B. Yakimov p. 754  abstract

Comparative Study of Cathode and Magnetron Sputtering Methods for Depositing
Pb(TiZr)O₃ Ferroelectric Film

V. G. Beshenkov, A. G. Znamenskii, and V. A. Marchenko p. 758  abstract

Study of Elemental and Phase Composition of PZT Thin Films by Auger Depth Profiling

V. G. Beshenkov, V. A. Marchenko, and A. G. Znamenskii p. 761  abstract

Study of Irradiated Superconducting Films by SPM Techniques

S. V. Antonenko, S. M. Tolkacheva, and V. A. Frolova p. 766  abstract

Oriented Surface Self-Segregation in Lead Titanate Single Crystals

Yu. Ya. Tomashpolskii and N. V. Sadovskaya p. 769  abstract

On the Technique of Absolutization of Diffuse Scattering Intensity Measurements Based
on Thermal Diffuse Scattering Measurements

V. T. Bublik, K. D. Shcherbachev, M. I. Voronova, and E. V. Zhevnerov p. 773  abstract

On One Possibility of the Mathematical Modeling of the Dependence of Cathodoluminescence
Intensity on the Energy of Beam Electrons with the Use of the Power Series Approximation
in the Problem of Identifying the Parameters of Semiconductor Materials

T. I. Kovtunova, N. N. Mikheev, A. N. Polyakov, and M. A. Stepovich p. 778  abstract

SIMS Diagnostics of the Structure of Nanometer-Sized Semiconducting
Layers Doped with Impurities

A. N. Pustovit p.784  abstract

Peculiarities of Electron Exchange between a Negative Hydrogen Ion and Atomic Chains

T. N. Polivnikova, K. K. Satarin, A. A. Khaidarov, and I. K. Gainullin p. 788  abstract

Scanning Helium Ion Microscope: Distribution of Secondary Electrons and Ion Channeling

Yu. V. Petrov, O. F. Vyvenko, and A. S. Bondarenko p. 792  abstract

Investigation into the Formation of X-Ray Photopolymer Lenses

T. A. Sagdullin, L. G. Shabel’nikov, and D. V. Irzhak p. 796  abstract

Formation of Nanostructures on the Surface of Polymer Films by an Atomic Force Microscope Tip

A. N. Stepanov and D. A. Yashunin p. 803  abstract

Use of Cluster Secondary Ions for Minimization of Matrix Effects in the SIMS
Depth Profiling of La/B₄C Multilayer Nanostructures

M. N. Drozdov, Yu. N. Drozdov, M. M. Barysheva, V. N. Polkovnikov, and N. I. Chkhalo p. 807  abstract

Oriented Surface Autosegregation in the Lead Germanate Single Crystals

Yu. Ya. Tomashpolsky and N. V. Sadovskaya p. 811  abstract

The Effect of Heating on Optical Properties and Radiation Resistance of Coatings Based
on Micro- and Nanosized Aluminum Oxide Powders

M. M. Mikhailov, T. A. Burtseva, and A. N. Lapin p. 817  abstract

Diffracted Channeling Radiation for Axial Electron Channeling

K. B. Korotchenko, Yu. L. Pivovarov, T. A. Tukhfatullin, and E. I. Fiks p. 823  abstract

Kinetics of the Formation of Gas Bubbles during Polarization of Copper and Graphite Electrodes
in Electrolytic Aqueous Solutions

A. M. Orlov, I. O. Yavtushenko, and M. V. Churilov p. 831  abstract

Thin Film Semiconductor Islands and Numerical Experiment

G. I. Zmievskaya and A. L. Bondareva p. 836  abstract

Radiation Damage of Material Surfaces under Prolonged Irradiation with He⁺ and Ar⁺ Ions
with Broad Energy Spectra

B. A. Kalin, N. V. Volkov, S. E. Sabo, and S. V. Zaitsev p. 845  abstract

Ion-Implanted Deuterium Accumulation in a Deposited Tungsten Coating

V. V. Bobkov, A. V. Onishchenko, O. V. Sobol’, R. I. Starovoitov, Yu. I. Kovtunenko,
Yu. E. Logachev, and L. P. Tishchenko p. 852  abstract

The Schottky Barrier at Homogeneous Impurity Distribution in a Semiconductor

V. B. Bondarenko, A. V. Filimonov, and E.Yu. Koroleva p. 859  abstract

Interfacial Polarization in Statistical Mixtures

V. A. Sotskov p. 862  abstract

Partial Local Connectivity on Different Surfaces

N. L. Smirnova p.866  abstract

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