Contents

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques

Vol. 14, No. 4, 2020

Injection System for the Siberian Ring Source of Photons

S. M. Gurov, V. N. Volkov, K. V. Zolotarev and A. E. Levichev p. 651  abstract

Double- and Triple-Crystal X-Ray Diffraction Analysis of Face-Grown Gd3Ga3Al2O12:Ce Crystals

I. A. Eliovich, V. I. Akkuratov, A. E. Blagov, O. A. Buzanov, M. V. Korghik, A. G. Kulikov, Yu. V. Pisarevsky, P. A. Prosekov, A. V. Targonskii and M. V. Kovalchuk p. 655  abstract

Superprotonics: New Materials for Energy-Efficient Technologies

V. V. Grebenev, I. P. Makarova, E. V. Selezneva, V. A. Komornikov and I. S. Timakov p. 660  abstract

Synthesis, Microstructure, Dielectric and Ferroelectric Properties of (Na,Bi,K)TiO3 Ceramics

G. M. Kaleva, E. D. Politova, A. V. Mosunov, S. Yu. Stefanovich, A. B. Loginov, D. R. Kashapov, A. A. Efremova, T. A. Koksharova, Yu. V. Khripunov and B. A. Loginov p. 663  abstract

Nanocarbon in the Structure of a Hypereutectic Aluminum-Matrix Composite

A. S. Aronin, I. M. Aristova, G. E. Abrosimova, V. V. Vasenev and V. N. Mironenko p. 668  abstract

The Structure of Bismuth-Ferrite Hybrid Materials Obtained via Transient Electrolysis

A. V. Khramenkova, D. N. Ariskina, A. I. Izvarin, A. V. Arzumanova and O. E. Polozhentsev p. 673  abstract

Cadmium Whisker Microcrystals on the Surface of Niobium–Cadmium Films

V. N. Volodin, Yu. Zh. Tuleushev, B. M. Sukurov, E. A. Zhakanbaev and A. S. Kerimshe p. 679  abstract

On the Plasma-Electrolytic Formation of Porous Films of Titanium Oxide

M. Yu. Makhmud-Akhunov and A. A. Adamovich p. 684  abstract

Effect of the Preliminary Heat Treatment of Chlorinated Polyvinyl Chloride on the Formation of Carbon Nanofibers on its Surface under High-Power Ion-Beam Irradiation

V. S. Kovivchak, A. B. Arbuzov and M. V. Trenikhin p. 691  abstract

A Study of the Surface Morphology of Microfiltration Membranes of the MFFK and MPS Brands by Atomic-Force- and Scanning-Electron Microscopy

S. V. Kovalev, S. I. Lazarev and O. A. Kovaleva p. 696  abstract

Influence of the Ordering of a Binary Alloy on the Emission of its Components

K. A. Tolpin, K. F. Minnibaev and V. E. Yurasova p. 706  abstract

On Modeling the Distributions of Minority Charge Carriers Generated by a Wide Electronic Beam in Planar Multilayer Semiconductor Structures

E. V. Seregina, V. V. Kalmanovich and M. A. Stepovich p. 713  abstract

Localization of Small Impurities of Water and Carbon Dioxide in Channels of the Structure of Natural Cordierite

A. P. Dudka, M. A. Belyanchikov, V. G. Thomas, Z. V. Bedran and B. P. Gorshunov p. 718  abstract

Controlling Properties of Interfaces in Nonlinear Sandwich-Type Structures with a Defocusing Internal Layer

S. E. Savotchenko p. 722  abstract

Influence of Quenched Non-Magnetic Impurities on Phase Transitions in Low-Dimensional Potts Models

A. K. Murtazaev and A. B. Babaev p. 727  abstract

Analysis of Confidence Intervals for Regression Model Parameters, Based on the Fowler–Nordheim Law

N. V. Egorov, A. Yu. Antonov and M. I. Varayun’ p. 730  abstract

Reflection of Hydrogen Isotopes and Helium Atoms from the Surface of the First Wall of the ITER Tokamak

D. S. Meluzova, P. Yu. Babenko, A. P. Shergin and A. N. Zinoviev p. 738  abstract

Evolution of the Energy and Angular Distributions of Emitted Atoms with a Variation in the Atomic Number of the Target Substance

V. N. Samoilov and A. I. Musin p. 743  abstract

Penetration of a Vortex Lattice into the Bulk of a Liquid

S. V. Filatov and A. A. Levchenko p. 751  abstract

New Approach for Time-Resolved Reciprocal Space Mapping with Adaptive X-Ray Optics

I. A. Eliovich, V. I. Akkuratov, A. V. Targonskii, P. A. Prosekov, A. E. Blagov, Yu. V. Pisarevsky and M. V. Kovalchuk p. 756  abstract

Flints as Nanostructured Chalcedonies

R. V. Gaynutdinov, V. V. Voronov, E. V. Chernova, V. A. Maslov, M. N. Mayakova, A. S. Chislov, I. A. Novikov and P. P. Fedorov p. 762  abstract

Effect of Bismuth on the Structural Perfection of Elastically Strained AlGaInSbBi Epitaxial Layers Grown on InSb Substrates

D. L. Alfimova, M. L. Lunina, L. S. Lunin, O. S. Pashchenko, A. S. Pashchenko and A. N. Yatsenko p. 771  abstract

The Influence of Low-Energy Ion-Plasma Treatment on the Surface Morphology of Pt Films with Varying Strength of Crystalline Texture

R. V. Selyukov, M. O. Izyumov and V. V. Naumov p. 777  abstract

Angular Dependences of Silicon Sputtering by Gallium Focused Ion Beam

V. I. Bachurin, I. V. Zhuravlev, D. E. Pukhov, A. S. Rudy, S. G. Simakin, M. A. Smirnova and A. B. Churilov p. 784  abstract

Some Features of the Electron Exchange between Ions and a Metal Surface Caused by its Atomic Structure

A. F. Aleksandrov, I. K. Gainullin and M. A. Sonkin p. 791  abstract

Precision Measurements of the Intensity in the Electron Diffraction Analysis

A. K. Kuligin and A. S. Avilov p. 798  abstract

Study of Secondary Ion Emission in the “Thermal Spike” Mode

Yu. Kudryavtsev, I. Guerrero and R. Asomoza p. 803  abstract

Molecular-Dynamics Simulation of Silicon Irradiation with Low-Energy Noble Gas Ions

A. A. Sycheva and E. N. Voronina p. 808  abstract

Theoretical Explanation of the Effect of a Decrease in the Si(111) Plasmon Energy during the Implantation of Ions with a Large Dose

A. S. Rysbaev, J. B. Khujaniyozov, M. T. Normuradov, A. K. Tashatov, B. D. Igamov and S. T. Abraeva p. 816  abstract

Radiation Defects Induced by Proton Exposure in Hollow Zinc-Oxide Particles

A. N. Dudin, V. V. Neshchimenko and V. Yu. Yurina p. 823  abstract

Microscopic and X-Ray Analysis of the Surface Changes in Aluminum Alloys during Friction

O. O. Shcherbakova, T. I. Muravyeva, I. V. Shkalei, I. Yu. Tsukanov and D. L. Zagorskiy p. 830  abstract

Potential Energy of Atom—Atom Interaction Taking Into Account the Pauli Principle

V. P. Koshcheev and Yu. N. Shtanov p. 841  abstract

Portable Hardness Tester for Instrumental Indentation

E. V. Gladkikh, I. I. Maslenikov, V. N. Reshetov and A. S. Useinov p. 846  abstract

α-FeSi2 as a Buffer Layer for β-FeSi2 Growth: Analysis of Orientation Relationships in Silicide/Silicon, Silicide/Silicide Heterointerfaces

I. A. Tarasov, I. A. Bondarev and A. I. Romanenko p. 851  abstract

Method for Manufacturing Silicon X-Ray Masks Via Plasma Chemical Etching

A. N. Gentselev, F. N. Dultsev, B. G. Goldenberg and K. E. Kuper p. 862  abstract