on the Surfaces of Carbon
Silicon (a-C:H) Composite Films
Contents
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Vol. 1, No. 3, 2007
Simultaneous English language translation of the journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Technique ISSN 1027-4510.
X-Ray Intensity Distribution in the Image Plane of Elliptic Multilayer Mirrors
A. D. Akhsakhalyan, V. A. Murav’ev, and N. N. Salashchenko p. 235 abstract
Diffraction Reflection of X-ray Radiation with a Two-Dimensionally Bounded Wavefront
from Perfect Crystals
V. A. Bushuev and A. P. Oreshko p. 240 abstract
Role of the Dislocation Screw Component in the Formation of the Dislocation Structure
in Ge- and Si-Based Semiconductor Heterosystems
E. M. Trukhanov, A. V. Kolesnikov, A. S. Ilin, A. Yu. Krasotin, A. P. Vasilenko,
A. S. Deryabin, M. M. Kachanova, and A. K. Gutakovsky p. 247 abstract
X-Ray Study of Structural Features of GaSb(Si) Single Crystals Grown
Using a Set of Diffraction Methods under Various Heat and Mass Transfer Conditions
I. A. Prokhorov, Yu. A. Serebryakov, E. N. Korobeinikova, B. G. Zakharov,
V. V. Ratnikov, and I. L. Shul’pina p. 255 abstract
X-Ray Topography Study of Microsegregation in Crystals
I. A. Prokhorov, I. Z. Bezbakh, B. G. Zakharov, and I. L. Shul’pina p. 260 abstract
X-Ray Spherical Wave Scattering Patterns of the Epitaxial Si/GeSi/Si (001) Heterosystem
A. S. Ilin, A. P. Vasilenko, E. M. Trukhanov, A. V. Kolesnikov, and A. A. Fedorov p. 265 abstract
TEM Study of the Structure of Gallium Nitride Epitaxial Films Grown on Substrates
with Different Interface Morphologies
A. A. Sitnikova, S. G. Konnikov, D. A. Kirilenko, M. G. Mynbaeva,
M. A. Odnoblyudov, V. E. Bugrov, and T. Lang p. 269 abstract
Simulation of the Spatial Structure of X-ray Beams under Conditions
of the Correction of the Heat Flow Incident on a Crystal
A. S. Markelov, V. N. Trushin, E. V. Chuprunov, and A. A. Zholudev p. 273 abstract
Wavelet Processing of Topographic High Dynamic Range Images
V. A. Tkal’, A. O. Okunev, M. N. Petrov, and L. N. Danil’chuk p. 277 abstract
Computer Study of the Temperature Dependence of Physical Properties
of Noncrystalline Silicon Nanoparticles
A. E. Galashev, I. A. Izmodenov, O. A. Novruzova, and A. N. Novruzov p. 286 abstract
Features of the Formation of Thermal Donors in Silicon under Elastic Tensile Stress
I. I. Novak† and G. A. Oganesyan p. 294 abstract
Microanalysis Station at the Kurchatov Synchrotron Radiation Source
A. N. Artemiev, N. A. Artemiev, A. V. Zabelin, V. V. Kvardakov, B. F. Kirillov,
A. G. Maevskii, O. V. Naida, and A. A. Dyatlov p. 298 abstract
New Type of Regular Carbon Nanostructures: Nanocones
on the Surfaces of CarbonSilicon (a-C:H) Composite Films
V. D. Frolov, S. M. Pimenov, E. V. Zavedeev, V. I. Konov, E. N. Lubnin, and G. G. Kirpilenko p. 303 abstract
Fabrication of X-ray Masks on a Thick Substrate for Deep X-ray Lithography
E. V. Petrova, B. G. Gol’denberg, V. I. Kondrat’ev, L. A. Mezentseva,
V. F. Pindyurin, A. N. Gentselev, V. S. Eliseev, and V. V. Lyakh p. 307 abstract
Study of the Process of PbS Nanocrystal Formation in Lead Stearate
and Behenate Langmuir
Blodgett Films by Electron Diffraction and X-ray Reflectometry
V. V. Klechkovskaya, L. G. Yanusova, G. I. Ivakin, N. A. Arkharova, R. V. Gaynutdinov,
N. D. Stepina, A. S. Orekhov, and V. V. Volkov p. 312 abstract
Structure and Radiation Properties of Dislocations
Arising during Oxygen Precipitate Growth in Silicon
E. A. Steinman, A. N. Tereshchenko, and V. Ya. Reznik p. 318 abstract
Effect of Surface Excitations on the Reflection Electron Energy Loss Spectrum in Silicon
A. S. Parshin, G. A. Aleksandrova, and A. V. Zyuganova p. 323 abstract
Sputtering of Boron Nitride Single Crystals of Different Structure
V. E. Yurasova, S. S. Elovikov, and E. Yu. Zykova p. 328 abstract
Mass Spectrometry Study of the Kinetics of CdTe Molecular-Beam Epitaxy:
Part I. Cd, Te2, and CdTe
V. I. Mikhailov, L. E. Polyak, and V. M. Kanevskii p. 342 abstract
Simulation of the MFM Contrast from Small Low-Coercive Ferromagnetic Nanoparticles
in an External Field
V. L. Mironov, D. S. Nikitushkin, D. S. Petrov, A. B. Shubin, and P. A. Zhdan p. 348 abstract
Magnetic Force Microscopy of GaAs:Mn Ferromagnetic Semiconductors
D. O. Filatov and E. I. Malysheva p. 352 abstract
Nanocrystalline Ni
Mn Solid Solutions: New Materials with Competing Exchange Interaction
Yu. A. Babanov, V. P. Pilyugin, T. Miyanaga, A. M. Patselov,
E. G. Chernyshev, A. V. Ryazhkin, and T. Ogasavara p. 359 abstract
Off-Plane Grazing-Incidence Blazed Grating with Radial Grooves
as an Efficient Spectral Purity Filter for EUV Lithography
L. I. Goray p. 362 abstract
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