Contents

Optoelectronics, Instrumentation and Data Processing

Vol. 60, No. 4, 2024

Physical Fundamentals of Micro- and Nanotechnologies and Optical Electronics

Cleavage of Submicron Solid Films As a Method to Prepare Cross Sections from Heterostructures for High-Resolution Transmission Microscopy

A. B. Vorob’ev, A. K. Gutakovsky, and V. Ya. Prinz p. 447  abstract

Molecular Beam Epitaxy of Germanium on Si(001) for Photodetectors in the Spectral Range from 1.31 to 1.55 \({\mu}\)m

K. B. Fritzler, A. S. Deryabin, I. D. Loshkarev, A. I. Nikiforov, I. B. Chistokhin, A. V. Kolesnikov, A. P. Vasilenko, O. P. Pchelyakov, L. V. Sokolov, K. E. Pevchikh, V. V. Svetikov, and A. K. Gutakovskii p. 457  abstract

Black Al on SiON Prepared by Magnetron Sputtering

O. V. Naumova, A. V. Tsarev, E. G. Zaytseva, A. Yu. Petin, Yu. A. Zhivodkov, S. A. Ponomarev, and A. S. Yaroshevich p. 463  abstract

Semitransparent Heater Based on Thin Gold Films

D. A. Kolosovsky, and S. V. Starinskiy p. 469  abstract

Structure and Properties of Vertically Oriented Carbon Nanotubes Grown on the Hafnium Oxide Surface

D. V. Shcheglov, S. V. Rodyakin, D. A. Nasimov, N. N. Kurus’, A. S. Borovik, V. A. Seleznev, L. I. Fedina, D. I. Rogilo, O. I. Semenova, and A. V. Latyshev p. 480  abstract

Corrugated Semiconductor Nanomembranes Based on Strained Heterostructures: Fabrication and Magnetotransport

V. A. Seleznev, S. V. Golod, A. B. Vorob’ev, E. V. Kozik, A. V. Prinz, and V. Ya. Prinz p. 488  abstract

Nanometer Layers and Structures in Silicon Electronics

V. P. Popov, V. A. Antonov, M. S. Tarkov, A. V. Myakon’kikh, and K. V. Rudenko p. 495  abstract

Low-Temperature Conductance of Nanosystems under Conditions of Weak Coupling with a Microwave Generator

A. S. Jaroshevich, V. A. Tkachenko, Z. D. Kvon, N. S. Kuzmin, O. A. Tkachenko, D. G. Baksheev, I. V. Marchishin, A. K. Bakarov, E. E. Rodyakina, V. A. Antonov, V. P. Popov, and A. V. Latyshev p. 505  abstract

Effect of Humidity and an Electrical Field on the Process of Local Anode Oxidation by an Atomic Force Microscope Probe on the Si(111) Surface

D. V. Shcheglov, L. I. Fedina, and A. V. Latyshev p. 522  abstract

Optical-Physical Methods of Research and Measurement

Surface-Enhanced Raman Scattering from GaP Nanowires with a Gallium Droplet

A. V. Taranenko, L. S. Basalaeva, V. V. Fedorov, V. S. Tumashev, and A. G. Milekhin p. 529  abstract

Research of Scanning Nonuniformity in an Optical Interference Microscope

I. A. Vykhristyuk, R. V. Kulikov, and E. V. Sysoev p. 536  abstract

Identification of Acoustic Emission Signatures of Direct Laser Melting Process

K. A. Stepanova, D. O. Kuzivanov, A. V. Fedorov, and I. Yu. Kinzhagulov p. 543  abstract

Numerical Simulations in Physical and Engineering Research

Parallel Simulation Methods of Heteroepitaxial Growth on Multiprocessor Systems with Shared Memory

K. V. Pavskii, A. L. Revun, S. A. Rudin, E. N. Peryshkova, and M. G. Kurnosov p. 549  abstract