Vol. 57, No. 1, 2021

Optoelectronics, Instrumentation and Data Processing

Estimating the Frequency Parameters of LFM Signal by a Sample of Increasing Size

V. A. Shcherbachev p. 1 abstract

Comparison of Detectors of Image Singular Points and Estimation of Their Statistical Characteristics

A. K. Shakenov p. 8 abstract

Optimizing the Neural Network Detector of Moving Objects

D. V. Svitov, S. A. Alyamkin p. 18 abstract

Approach to the Detection of Anomalies in Process Signals by Using the Hilbert–Huang Transform

D. A. Murzagulov, A. V. Zamyatin, O. V. Romanovich p. 27 abstract

Identifying the Vaccinia Virus with the Use of a Nanowire Silicon-on-Insulator Biosensor

V. M. Generalov, O. V. Naumova, S. A. P’yankov, I. V. Kolosova, A. S. Safatov, B. N. Zaitsev, E. G. Zaitseva, G. A. Buryak, A. A. Cheremiskina, N. A. Filatova, A. L. Aseev p. 37 abstract

Validation of Heterophase RNA Analysis with the Use of a Silicon-on-Insulator Biosensor

E. V. Dmitrienko, A. V. Poryvaeva, O. V. Naumova, B. I. Fomin, M. S. Kupryushkin, I. A. Pyshnaya, D. V. Pyshnyi p. 44 abstract

Optical-Acoustic Detectors of IR and THz Radiation with Nano-Electro-Mechanical Elements Based on Single-Layer Graphene

I. S. Gibin, P. E. Kotlyar p. 51 abstract

Analytical Solution for the Actuators Influence Functions of a Circular Deformable Mirror with Free Edge under Concentrated Loads

D. A. Yagnyatinskiy, V. N. Fedoseyev p. 60 abstract

Analytical Model of an Optoelectronic Probe for Measuring Small Axial Displacements

A. V. Mineev, V. Kh. Yasoveev p. 70 abstract

Remote Formation of Holographic Record

S. A. Shoidin, A. L. Pazoev p. 80 abstract

Experimental Study of Pulse Laser Location of Retroreflective Objects

D. V. Alantev, S. M. Borzov, B. I. Kozik, O. I. Potaturkin, S. B. Uzilov, K. R. Yaminov p. 89 abstract

V-Scoring of Silicon Instrument Plates by Laser Radiation in Water Medium

A. R. Novoselov p. 97 abstract

Focusing of Ultrasonic Energy in a Given Region of a Biological Object with Allowance for the Interface between Two Media

V. P. Yushchenko, V. G. Edvabnik, O. V. Gofman, T. V. Duluba, V. N. Legkii p. 106 abstract

Contents

Optoelectronics, Instrumentation and Data Processing