Contents
Russian Microelectronics


Vol. 26, No. 6, 1997

Simultaneous English language translation of the journal is available from maik nauka / Interperiodica Publishing (Russia).
Distributed worldwide by Plenum / Consultants Bureau. Russian Microelectronics ISSN 1063-7397.


Nonlinear Distortions in Analog ICs

T. M. Agakhanyan p. 345  abstract

A One-Dimensional Model of GaAs MESFETs with a Complex Doping Profile

V. A. Gergel’ and M. V. Timofeev p. 355  abstract

A Magnetoresistive Neurochip: Architecture and Operation

V. G. Red’ko and K. A. Zvezdin p. 360  abstract

Scanning Probe (Tunneling and Force) Microscopy in Metrological Problems of Nanoelectronics

P. A. Arutyunov and A. L. Tolstikhina p. 365  abstract

Charge Degradation of MIS Structures with Phosphosilicate Glass–passivated Thermal Silicon Oxide
at High-Field Tunnel Injection

V. V. Andreev, V. G. Baryshev, G. G. Bondarenko, A. A. Stolyarov, and V. A. Shakhnov p. 378  abstract

Low-Melting Glass Reflow in Heat-stimulated Planarization of Microelectronic Structures

S. P. Zhvavyi, G. D. Ivlev, V. A. Pilipenko, and V. N. Ponomar’ p. 384  abstract

The Application of Octavinylsilsesquioxane as a Vacuum Electron Resist for Nanolithography

L. V. Litvin, T. A. Gavrilova, A. E. Plotnikov, A. K. Gutakovskii, Yu. V. Nastaushev, A. L. Aseev,
F. N. Dul’tsev, K. P. Mogil’nikov, M. R. Baklanov, S. A. Prokhorova, L. D. Nikulina, S. M. Volkova,
T. I. Liskovskaya, V. S. Danilovich, B. Spangenberg, and S. Altmeyer
p. 387  abstract

On the Possibility to Stabilize the Parameters of Photosensitive Polycrystalline Lead Sulfide Films

V. G. Tsukerman p. 394  abstract

A Magnetoresistive Memory Cell Made of Magnetostrictive Permalloy

V. A. Nikonenko p. 397  abstract

Charge Localization on Hydrophobic and Hydrophilic Silicon Surfaces and in an Oxide Film

Yu. S. Zharkikh, V. V. Pyatnitskii, and O. V. Tretyak p. 400  abstract

Logic Elements Based on Spin-Valve Magnetoresistive Structures

N. P. Vasil’eva and S. I. Kasatkin p. 406  abstract

Three-Dimensional Formations on the Surface of SIMOX Structures at High-Temperature Annealing

S. A. Krivelevich, M. I. Makoviichuk, and V. A. Rekshinskii p. 412  abstract

Author Index to Volume 26, 1997 p. 415  abstract


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