Contents
Russian Microelectronics

Vol. 35, No. 6, 2006

Simultaneous English language translation of the journal is available from Pleiades Publishing, Inc.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.

Materials and Microstructure Characterization

Anomalous Photoconductivity Decay Observed in Microwave Measurements
of Carrier Lifetime in Silicon Ingots

P. A. Borodovskii, A. F. Buldygin, and A. S. Tokarev p. 345  abstract

Microwave Characterization of Undoped Polycrystalline Silicon

P. A. Borodovskii, A. F. Buldygin, A. T. Drofa, and A. S. Tokarev p. 350  abstract

Characterization and Sensors

Paramagnetic-Center Detection by SQUID Measurement of Static Magnetic Susceptibility

A. I. Golovashkin, A. L. Karuzskii, V. M. Mishachev, A. A. Orlikovsky,
V. V. Privezentsev, and A. M. Tshovrebov p. 354  abstract

Anomalous Kossel Effect in Semiconductor Structures

P. G. Medvedev, A. M. Afanas’ev, and M. A. Chuev p. 359  abstract

Process Technologies

Axially Symmetric Composite Electromagnetic Mirror for Perfect Axial-Aberration Correction

V. A. Zhukov and A. V. Zav’yalova p. 372  abstract

Ultimate Thermomechanical Read Rate from AFM Data Storage

A. B. Petrin p. 382  abstract

Thin Films

Size Effect Relating to the Extraordinary and the Ordinary Hall Effect in Ultrathin Fe–Pt Films

V. N. Matveev, V. I. Levashov, O. V. Kononenko, and A. N. Chaika p. 392  abstract

Modeling and Simulation

Equivalent Electrical Network of the DNA Molecule

N. V. Grib, J. A. Berashevich, and V. E. Borisenko p. 398  abstract

Circuit Analysis and Synthesis

Low-Power CMOS Switched-Capacitor Lowpass Filter Using Current Conveyors

A. S. Korotkov, D. V. Morozov, and A. A. Tutyshkin p. 405  abstract

Author Index to Volume 35, 2006 p. 414

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