Contents
Russian Microelectronics

Vol. 33, No. 6, 2004

Simultaneous English language translation of the journal is available from MAIK “Nauka / Interperiodica” (Russia).
Distributed worldwide by Springer Science+Business Media, Inc. Russian Microelectronics ISSN 1063-7397.

Materials and Microstructure Characterization

Noncontact Temperature Measurement on Dielectrics
and Semiconductors, Part 1

V. K. Bitukov and V. A. Petrov p. 329  abstract

SEM Linear Measurement in a Wide Magnification Range

Ch. P. Volk, E. S. Gornev, Yu. A. Novikov, Yu. V. Ozerin,
Yu. I. Plotnikov, and A. V. Rakov p. 342  abstract

Silicon-Ingot Inspection by Active IR Imaging

V. A. Yuryev, V. P. Kalinushkin, A. P. Lytkin, and S. I. Lyapunov p. 350  abstract

Methods of Multiplex Spectroscopy in the Characterization
of Nanoscale Multilayers

V. A. Kotenev p. 353  abstract

Process Technologies

Delta-Doping of Monocrystalline Semiconductors
by Al and Sb Implantation Using FIB Resistless Lithography

V. A. Zhukov, N. T. Bagraev, A. I. Titov, and E. E. Zhurkin p. 362  abstract

Micro- and Nanoelectronic Devices

1D GaAs Detector Arrays for Digital X-ray Imaging

V. F. Dvoryankin, Yu. M. Dikaev, A. I. Krikunov, A. A. Kudryashov,
A. A. Telegin, E. A. Babichev, S. E. Baru, V. V. Porosev, and G. A. Savinov p. 373  abstract

The Bulk-Recombination Mechanism of Negative Relative
Sensitivity Observed in Bipolar Magnetotransistors

R. D. Tikhonov p. 377  abstract

Circuit Analysis and Synthesis

Chaotic Negative-Resistance Oscillators with a Multibranch
Piecewise-Linear Current–Voltage Characteristic

V. G. Prokopenko p. 381  abstract

Author Index to Volume 33, 2004 p. 390

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