Contents
Russian Microelectronics

Vol. 30, No. 6, 2001

Simultaneous English language translation of the journal is available from MAIK “Nauka / Interperiodica” (Russia).
Distributed worldwide by Kluwer Academic / Plenum Publishers. Russian Microelectronics ISSN 1063-7397.

In situ Diagnostics of Plasma Processes in Microelectronics: The Current Status
and Immediate Prospects, Part IV

A. A. Orlikovskii, K. V. Rudenko, and Ya. N. Sukhanov p. 343  abstract

Optical Second-Harmonic Microscopy Applied to the Local Probing of the State
of Polarization in Thin Films of Lead Zirconate Titanate

E. D. Mishina, N. E. Sherstyuk, K. A. Vorotilov, E. F. Pevtsov, A. S. Sigov, and T. Rasing p. 371  abstract

Anodic-Oxidation Growth of Microscopic Pillar Arrays: Kinetic Aspects

A. I. Vorob’eva p. 381  abstract

Negative Differential Conductance of a Quasi-Ballistic MESFET

S. V. Obolenskii and M. A. Kitaev p. 394  abstract

Minority-Carrier Generation at the Interface between Silicon and Lead Borosilicate Glass

P. B. Parchinskii and S. I. Vlasov p. 401  abstract

Critical Velocities of Domain Walls in Magnetic Thin Films with Planar Anisotropy

B. N. Filippov, L. G. Korzunin, O. V. Sycheva, and V. I. Beresnev p. 406  abstract

Fractal Analysis of Anisotropic Surfaces

P. A. Arutyunov p. 411  abstract

Author Index to Volume 30, 2001 p. 414

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