Contents
Russian Microelectronics

Vol. 41, No. 6, 2012

A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.

Quantum Noise and the Quality Control of Hardware Components of Quantum Computers
Based on Superconducting Phase Qubits

Yu. I. Bogdanov, V. F. Lukichev, S. A. Nuyanzin, and A. A. Orlikovsky p. 325  abstract

Characterization of the Structure and Optical Properties of Micron Porous Layers
on Antimony-Doped Silicon Substrates

A. A. Lomov, M. A. Chuev, V. A. Balin, B. V. Nabatov, and A. L. Vasil’ev p. 336  abstract

Operation of an Electronic Lithograph in the Mode of a Scanning Electron Microscope

V. A. Kal’nov, Yu. A. Novikov, and A. A. Orlikovsky p. 347  abstract

Nonlinearity Estimation of Scanning on a Scanning Electron Microscope

V. V. Alzoba, M. A. Danilova, A. Yu. Kuzin, V. B. Mityukhlyaev, A. V. Rakov,
P. A. Todua, and M. N. Filippov p. 351  abstract

IR Photodetectors in the Range of = 1.5–8 m, Based on Silicon
with Multicharged Nanoclusters of Manganese Atoms

M. K. Bakhadyrkhanov, S. B. Isamov, and N. F. Zikrillaev p.354  abstract

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