Contents
Russian Microelectronics

Vol. 29, No. 6, 2000

Simultaneous English language translation of the journal is available from MAIK “Nauka / Interperiodica” (Russia).
Distributed worldwide by Kluwer Academic / Plenum Publishers. Russian Microelectronics ISSN 1063-7397.

Nonresonant Parametric Amplification of Signals in Neural Networks Through the Rhythms
of a Central Processor

Yu. I. Balkarei, V. O. Naguchev, M. G. Evtikhov, M. I. Elinson^†, and T. V. Kochiev p. 355  abstract

The Influence of Individual Layer Parameters on the Photoluminescent Properties
of In_xGa_1xAs/GaAs System

A. A. Lomov, R. M. Imamov, A. V. Guk, Yu. V. Fedorov, Yu. V. Khabarov, and V. G. Mokerov p. 362  abstract

Resistors Integrated into MCM-D Modules: Fabrication and Performance

A. I. Vorob’eva and K. V. Moskvichev p. 368  abstract

Ion-Bombardment-Induced Decomposition of Nonequilibrium Solid Solution
and the Formation of Periodic Structures

S. A. Krivelevich p. 376  abstract

A Helicon Plasma Source

O. V. Braginskii, A. N. Vasil’eva, and A. S. Kovalev p. 380  abstract

High-Rate Deposition of Amorphous Silicon

B. G. Budagyan, A. A. Sherchenkov, A. E. Berdnikov, and V. D. Chernomordik p. 391  abstract

Stabilization of Structure–Impurity and Electrophysical Parameters in the Si/SiO₂ System

N. Ya. Zaitsev, G. Ya. Krasnikov, and I. V. Matyushkin p. 397  abstract

Space Surface Parameters Determined from Fourier Transforms in Atomic Force Microscopy

P. A. Arutyunov and A. L. Tolstikhina p. 401  abstract

Identification of Trapping Effects and Ion Neutralization at the Insulator/Semiconductor Interface
of MIS Structures from Dynamic Current–Voltage Characteristics of Ion Depolarization

E. I. Gol’dman, A. G. Zhdan, and N. F. Kukharskaya p. 406  abstract

Radical Modification of Gate Oxide by Lateral Gettering of Electroactive Centers

V. Ya. Uritskii, A. P. Krylov, and S. E. Borisov p. 413  abstract

Electroactive Centers at the Outer Interface of an Ultrathin Oxide Layer and Their Effect on
the Electrical Performance of Single-Crystal Silicon/Noncrystalline Oxide/Polysilicon Structures

V. Ya. Uritskii, A. P. Krylov, and A. A. Bushlyakov p. 417  abstract

Author Index to Volume 29, 2000 p. 423

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