Contents
Russian Microelectronics

Vol. 26, No. 5, 1997

Simultaneous English language translation of the journal is available from / Interperiodica Publishing (Russia).
Distributed worldwide by Plenum / Consultants Bureau. Russian Microelectronics ISSN 1063-7397.

On the Conductivity Mechanism in Short-Channel Field-Effect Transistors
with Strong Potential Fluctuations

B. A. Aronzon, D. A. Bakaushin, A. S. Vedeneev, V. V. Ryl’kov, and V. E. Sizov p. 275  abstract

Phase Characteristics of Wide-Band Integrated Current-limiting Amplifiers

V. G. Prokopenko p. 281  abstract

Noise Parameters of Preamplifiers Built around Analog ICs

T. M. Agakhanyan p. 287  abstract

Features of the Associative Memory of a Self-learning Neural Network
with Special Coding Neurons for Stored Images

Yu. I. Balkarei, M. G. Evtikhov, M. I. Elinson, and A. S. Kogan p. 296  abstract

The Analysis and Design of a Scan Chain for Built-In VLSI Self-Test

V. N. Yarmolik, I. A. Murashko, and A. M. Shmidman p. 299  abstract

Estimation of the Component Basis Adequacy upon Designing Technical Systems

A. B. Galashkin p. 303  abstract

The Characterization of the Active Elements in the Output Stages of Thermionic
Vacuum Integrated Microcircuits

I. L. Grigorishin, G. I. Efremov, and N. I. Mukhurov p. 308  abstract

A Theoretical Model of Diffusion of Lithium and Boron Implanted into Diamond

G. V. Gadiyak p. 313  abstract

Simulation of Near-Surface Diffusion of Boron in Ion-doped Silicon

E. Yu. Zamalin, O. B. Bodnar’, V. N. Borod’ko, T. S. Gryaznova, and A. V. Medvedev p. 317  abstract

The Formation of Periodic Phase Structures upon Laser Crystallization of Films

V. I. Emel’yanov and A. A. Sumbatov p. 322  abstract

Laser Interference Thermometry of Silicon Monocrystalline Wafers with a Rough Surface

A. N. Magunov and A. Yu. Gasilov p. 329  abstract

Control of the Silicon Surface Quality with Nematic Liquid Crystals

N. I. Gritsenko and S. I. Kucheev p. 334  abstract

The Behavior of Metal Impurities during the Thermal Gettering of Silicon

D. I. Brinkevich, V. S. Prosolovich, and N. V. Vabishchevich p. 336  abstract

An Acoustic Transducer with Precise Focusing for Imaging of Internal Solid-State Microstructures

M. N. Preobrazhenskii, S. V. Vasil’chikov, V. P. Kirgetov, and A. A. Mironenko p. 340  abstract

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