Contents

Russian Microelectronics

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Vol. 45, No. 5, 2016

A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.

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Experimental Diamond Photonics: Current State and Prospects. Part I

A. V. Tsukanov and I. Yu. Kateev p. 299  abstract

Schmidt Decomposition and Analysis of Statistical Correlations

Yu. I. Bogdanov, N. A. Bogdanova, V. F. Lukichev, D. V. Fastovets and A. Yu. Chernyavskii p. 314  abstract

Physicochemical Deposition Features of Peritectic Alloys for High-Density Chipping of Silicon Crystals

V. M. Roshchin, V. L. Dshkhunyan, I. N. Petukhov, K. S. Sen’chenko and M. S. Vagin p. 324  abstract

Study of Plasma Radiation Spectra of (HCl + Ar, H₂, and Cl₂) Mixtures in GaAs Etching

A. V. Dunaev p. 329  abstract

Thin-Film Positive Electrode Based on Vanadium Oxides for Lithium-Ion Accumulators

S. V. Vasil’ev, V. N. Gerashchenko, T. L. Kulova, M. E. Lebedev, L. A. Mazaletskii, A. V. Metlitskaya, A. A. Mironenko, S. B. Moskovskii, N. F. Nikol’skaya, D. E. Pukhov, A. S. Rudyi, A. M. Skundin, V. A. Sologub, I. S. Fedorov and A. B. Churilov p. 335  abstract

Kinetics of the Interaction between a CCl₂F₂ Radio-Frequency Discharge and Gallium Arsenide

S. A. Pivovarenok, A. V. Dunaev and D. B. Murin p. 345  abstract

Charge Transport in Thin Layers of Ferroelectric Hf_0.5Zr_0.5O₂

O. M. Orlov, D. R. Islamov, A. G. Chernikova, M. G. Kozodaev, A. M. Markeev, T. V. Perevalov, V. A. Gritsenko and G. Ya. Krasnikov p. 350  abstract

Effect of the Reflection Coefficients on the Conductivity of a Thin Metal Layer in the Case of an Inhomogeneous Time-Periodic Electric Field

A. I. Utkin and A. A. Yushkanov p. 357  abstract

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