Contents
Russian Microelectronics

Vol. 29, No. 5, 2000

Simultaneous English language translation of the journal is available from MAIK “Nauka / Interperiodica” (Russia).
Distributed worldwide by Kluwer Academic / Plenum Publishers. Russian Microelectronics ISSN 1063-7397.

The Hyperfine Energy Spectrum of ³¹P Donors in a Silicon NMR Quantum Computer

K. A. Valiev, A. A. Kokin, A. A. Larionov, and L. E. Fedichkin p. 285  abstract

Formation of Local Insulating Regions in Si/Si–Ge Structures
by Ion Implantation with Subsequent Stain Etching

V. V. Starkov, E. A. Starostina, A. F. Vyatkin, and Yu. B. Gorbatov p. 294  abstract

Frequency-Response Equalization in Integrated Current Amplifiers
with Collector–Base Cross Coupling

V. G. Prokopenko p. 299  abstract

Performance Improvement of CCD Image Sensor Arrays

V. A. Arutyunov and O. V. Sorokin p. 303  abstract

Charge Transfer and Structural–Impurity Complexes
in the Transition Layer of the Si/SiO₂ System

G. Ya. Krasnikov, N. A. Zaitsev, and I. V. Matyushkin p. 307  abstract

Fabrication of 0.5-m Structures by Dry Electron Lithography
and Anisotropic Plasma Etching

I. I. Amirov and V. A. Fedorov p. 311  abstract

The Energy of Activation of Electromigration in Aluminum Conductors Tested
by the Drift-Velocity Method

O. V. Kononenko, V. N. Matveev, and D. P. Field p. 316  abstract

Low-Temperature Annealing of SIMOX Structures
in an Inhomogeneous Temperature Field

V. I. Rudakov, Yu. I. Denisenko, and B. V. Mochalov p. 324  abstract

An Adsorption Ellipsometric Method for Studying Porous Films and Coatings

V. A. Tolmachev p. 331  abstract

Discrete Electron States at the Si(100)/SiO₂ Interface

S. I. Kirillova, V. E. Primachenko, A. A. Serba, and V. A. Chernobai p. 345  abstract

Chip Training Conditions

M. I. Gorlov and P. Yu. Kovalenko p. 349  abstract

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