Contents
Russian Microelectronics
Vol. 38, No. 4, 2009
Simultaneous English language translation of the journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.
Micro- and Nanoelectronic Devices
Semiconductor Nanowire Sensors
I. G. Neizvestny p. 223 abstract
Dual-Collector Bipolar Magnetotransistor: Defining and Determining Its Magnetic-Field Sensitivity
R. D. Tikhonov p. 239 abstract
Micro- and Nanostructure Characterization
Dependence of the Transversal Magneto-Optic Kerr Effect on the Incidence Angle
of Light for Ultrathin Films of Cobalt and Co/Cu/Co Multilayers
V. V. Naumov, V. A. Paporkov, and M. V. Lokhankin p. 251 abstract
An Automated Stand for Express-Diagnostics of Magnetoresistive Structures
O. S. Trushin, D. A. Kokanov, V. F. Bochkarev, V. V. Naumov, E. Yu. Buchin p. 257 abstract
Device and Structure Modeling
and Simulation
Simulating the Exposure of ICs to Voltage Surges Caused by Nuclear Explosions
K. A. Epifantsev, O. A. Gerasimchuk, and P. K. Skorobogatov p. 260 abstract
The Accuracy and Validity of the Simulation of VLSI MOS Transistors
V. V. Denisenko p. 273 abstract
Computational Electrochemistry
Calculation of the Concentration Profile of Copper in the TiN/CoSi2/Si System during Thermal Heating
V. I. Rudakov and V. N. Gusev p. 279 abstract
Circuit Analysis and Synthesis
Constraint Graph Used to Minimize On-Chip Wiring Area with Regard to Electromigration
and Conductor Voltage Drop
A. S. Plekhanov p. 285 abstract
Information for Authors p. 288
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