Contents
Russian Microelectronics

Vol. 37, No. 4, 2008

Simultaneous English language translation of the journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.

Personalia

In Celebration of Alexander A. Orlikovsky’s 70th Birthday and 45-Year Career as a Scientist,
an Administrator, and an Educator p. 213

Materials and Microstructure Characterization

Formation of the TiN/CoSi₂ System by Rapid Thermal Annealing of a Co/Ti/Si Structure

V. I. Rudakov and V. N. Gusev p. 215  abstract

Potential Applications of LF-Noise Spectroscopy to the Development
of New-Generation Gas Sensors

M. I. Makoviychuk p. 226  abstract

Solid-State Devices

High-Frequency Admittance of a Thin Circular Semiconductor Wire

I. A. Kuznetsova, A. A. Yushkanov, and R. R. Khadchukaev p. 238  abstract

Silicon Multiplexers for 1 576 HgCdTe IR Focal-Plane Arrays

A. I. Kozlov, I. V. Marchishin, and V. N. Ovsyuk p. 245  abstract

Circuits and Systems

Power-Reduction Techniques for CMOS Pipelined ADCs

A. S. Gumenyuk and Yu. I. Bocharov p. 253  abstract

Comparative Analysis of Wideband CMOS Low-Noise Amplifiers for the RF Range

E. V. Balashov and A. S. Korotkov p. 264  abstract

Versatile Instrument for MOSFET Characterization

A. V. Klekachev, S. N. Kuznetsov, V. B. Pikulev, and V. A. Gurtov p. 277  abstract

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