Contents
Russian Microelectronics
Vol. 42, No. 3, 2013
A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.
Quantum Memory Based on Ensemble States of NV Centers in Diamond
A. V. Tsukanov p. 127 abstract
Quantum Error Correction in Silicon Charge Qubits
A. A. Melnikov and L. E. Fedichkin p. 148 abstract
Test Object for Calibrating the Transmission Electron Microscope
A. L. Vasilev, V. P. Gavrilenko, M. V. Kovalchuk, V. B. Mityukhlyaev, Yu. V. Ozerin,
A. V. Rakov, V. V. Roddatis, P. A. Todua, and M. N. Filippov p. 155 abstract
Field-Effect Transistor with Nanowire Channel Based on Heterogeneously Doped SOI
S. V. Amitonov, D. E. Presnov, V. I. Rudakov, and V. A. Krupenin p. 160 abstract
Chemically Amplified Resists for High-Resolution Lithography
S. A. Bulgakova, M. M. Jons, A. E. Pestov, M. N. Toropov, N. I. Chkhalo, S. A. Gusev,
E. V. Skorokhodov, and N. N. Salashchenko p. 165 abstract
Micromagnetic Software Package MICROMAG and Its Applications to Study Elements of Spintronics
O. S. Trushin and N. Barabanova p. 176 abstract
Calculation of the Flow Capacity of a Gas Channel in the Sources of Beams
of Fast Neutral Particles by Means of the Monte-Carlo Method
V. P. Kudrya and Yu. P. Maishev p. 184 abstract
An Iteration Algorithm of Coding Internal States of Finite-State Machines for Minimizing
the Power Consumption
V. V. Solovev and T. N. Grzes p.189 abstract
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