Vol. 45, No. 1, 2016
A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Russian Microelectronics ISSN 1063-7397.
Simulation of the Spectroscopic Response and Electron Dynamics in a Double Quantum Dot
p. 1 abstract
Influence of the Annealing Temperature on the Ferroelectric Properties of Niobium-Doped Strontium–Bismuth Tantalate
p. 11 abstract
Formation and Certain Properties of Zinc Chalcogenide Nanolayers on Semiconductor Matrices
p. 18 abstract
Characteristics of Chloride Memristors Based on Nanothick Metal Films
p. 26 abstract
System-on-Chip: Specifics of Radiation Behavior and Estimation of Radiation Hardness
p. 33 abstract
Effect of a Diamond Heat Spreader on the Characteristics of Gallium Nitride-Based Transistors
p. 41 abstract
Influence of Ionizing Radiation on the Parameters of an Operational Amplifier Based on Complementary Bipolar Transistors
p. 54 abstract
Multilayer Graphene-Based Flash Memory
p. 63 abstract
The Circuit and Functional Blocks for Radiation-Hard Transceiver LSICs in SOI CMOS
p. 68 abstract