Contents
Technical Physics

Vol. 60, No. 6, 2015

A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Technical Physics ISSN 1063-7842.

Theoretical and Mathematical Physics

Diffracted Transient Radiation of a Relativistic Electron in a Bilayer Target

S. V. Blazhevich, R. A. Zagorodnyuk, and A. V. Noskov p. 789  abstract

Simulation of the Nanofluid Viscosity Coefficient by the Molecular Dynamics Method

V. Ya. Rudyak and S. L. Krasnolutskii p. 798  abstract

Fractal Analysis of the 3D Microstructure of Porous Materials

A. N. Khlyupin and O. Yu. Dinariev p. 805  abstract

Asymptotic Form of the Matrix Elements of the Direct Collision Integral
in the Boltzmann Equation

E. A. Tropp and E. Yu. Flegontova p. 811  abstract

Internal Impedance of Twisted Steel-Aluminum Wires at an Industrial Frequency

A. G. Merkushev and I. A. Elagin p. 815  abstract

Determination of the Melt Level from a Real Weight Signal during Computer-Assisted Crystal Growth
by the Stepanov (EFG) Technique and the Use of Crucible Motion as a Control Action

S. N. Rossolenko, D. O. Stryukov, and V. N. Kurlov p. 820  abstract

Atomic and Molecular Physics

Spin Exchange upon Collision of Two Cesium Atoms in the Ground State

S. P. Dmitriev, N. A. Dovator, and V. A. Kartoshkin p. 826  abstract

Fragment Appearance Energies in Dissociative Ionization of a Sulfur Hexafluoride Molecule
by Electron Impact

Sh. Sh. Demesh, A. N. Zavilopulo, O. B. Shpenik, and E. Yu. Remeta p. 830  abstract

Gases and Liquids

Nonlinear Corrections to the Frequencies of Surface and Subsurface Waves
in a Laminated Heterogeneous Liquid

S. O. Shiryaeva, M. S. Fedorov, and A. I. Grigor’ev p. 839  abstract

Solid State

Kinetics of Structuring of Submonolayer Carbon Coatings on Silicon (100) Crystals
during Microwave Vacuum–Plasma Deposition

R. K. Yafarov and V. Ya. Shanygin p. 848  abstract

Relation between Mechanical Dynamic Processes and the Accompanying Electric Fields

Yu. K. Bivin p. 855  abstract

Dielectric Properties of the Lithium–Titanium Ferrite Ceramics in a Wide Frequency Range

A. P. Surzhikov, S. A. Gyngazov, E. N. Lysenko, T. S. Frangul’yan, and A. V. Malyshev p. 860  abstract

Dynamic Strength of Reaction-Sintered Boron Carbide Ceramic

A. S. Savinykh, G. V. Garkushin, S. V. Razorenov, and V. I. Rumyantsev p. 863  abstract

Strength of Optical Silica Fibers Measured in Liquid Nitrogen

L. G. Baikova, T. I. Pesina, M. F. Kireenko, L. V. Tikhonova, and C. R. Kurkjian p. 869  abstract

Determination of the Real Crystal Radius from a Weight Signal during Growth
by the Stepanov (EFG) Technique

S. N. Rossolenko, D. O. Stryukov, and V. N. Kurlov p. 873  abstract

Physical Science of Materials

AFM and XPA Data on Structural Features and Properties of Films and Powders
Based on Naphthalocyanines

A. G. Ramonova, A. T. Nakusov, V. G. Sozanov, A. P. Bliev, and T. T. Magkoev p.877  abstract

Melting of a Thin Aluminum Film on a Dielectric Substrate under a High-Power Ion Beam

V. S. Kovivchak, T. V. Panova, and R. B. Burlakov p. 885  abstract

Solid State Electronics

Measuring Complex for Studying Cascade Solar Photovoltaic Cells and Concentrator Modules
on Their Basis

V. R. Larionov, D. A. Malevskii, P. V. Pokrovskii, and V. D. Rumyantsev p. 891  abstract

High-Voltage Sharp-Recovery 4H:SiC Drift Diodes: Theoretical Estimation of Limiting Parameters

P. A. Ivanov and I. V. Grekhov p. 897  abstract

Physics of Nanostructures

3D Fractalization over Natural Colloidal Microinclusions

A. P. Kuz’menko, Chan Nyein Aung, and V. V. Rodionov p. 903  abstract

Optics

Specific Imaging of Caustics upon Refraction of Structured Laser Radiation in Stratified Media

I. L. Raskovskaya p. 911  abstract

Electrophysics, Electron and Ion Beams,
Physics of Accelerators

On the Low-Energy High-Current Electron Beam Profile Controlled Using Ferromagnetic Insertions

P. P. Kiziridi and G. E. Ozur p. 917  abstract

Physical Electronics

Atomic–Molecular Model of Boundary Friction in Microtribocontacts
between the Surfaces of Semiconducting and Dielectric Materials

V. A. Kolpakov and N. A. Ivliev p. 922  abstract

Experimental Instruments and Technique

Sensitive Elements of Vacuum Sensors Based on Porous Nanostructured SiO₂–SnO₂ Sol–Gel Films

I. A. Averin, S. E. Igoshina, V. A. Moshnikov, A. A. Karmanov, I. A. Pronin, and E. I. Terukov p. 928  abstract

Short Communications

Intermittency of Intermittencies at the Phase Synchronization Boundary in the Presence of Noise

O. I. Moskalenko, A. A. Koronovskii, A. E. Hramov, and M. O. Zhuravlev p. 933  abstract

Dependence of Thermal Expansion Coefficient on Size and Shape of a Silicon Nanocrystal
at Various Temperatures

M. N. Magomedov p. 937  abstract

Spectrograph of Charged Particles Consisting of a Discrete Plane Electrode
with Different Potential Distributions and a Grounded Box-Shaped Electrode

T. Ya. Fishkova p.941  abstract

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