Vol. 68, No. 12, 2023
Modeling of Optical Concentrators for the Upgraded Camera of the TAIGA-IACT Cherenkov Gamma-Ray Telescope
p. 505 abstract
Simulation of Polycrystalline Beryllium Sputtering by H, D, T Atoms
p. 512 abstract
The Simulation of Proton Beam Passage through Thin Gold Films
p. 521 abstract
Using Terahertz Irradiation to Mitigate the Effects of Radiation Exposure
p. 530 abstract
Fragmentation of 2,5-Diketopiperazine Cyclic Dipeptide Ions
p. 539 abstract
Carbon-Coated Electron Field Emitters
p. 545 abstract
Investigation of the Characteristics of the InGaAs/InAlGaAs Superlattice for 1300 nm Range Vertical-Cavity Surface-Emitting Lasers
p. 549 abstract
The Lower Hybrid Frequency Range Wave Emission in the Ohmic Discharge of the FT-2 Tokamak
p. 558 abstract
Investigation of Focusing Properties of Photovoltaic Module Concentrator in a Wide Temperature Range
p. 566 abstract
Ultrafast Laser-Induced Control of Magnetic Anisotropy in Nanostructures
p. 574 abstract
ZnxFe3 – xO4 (0 $ \leqslant $ x $ \leqslant $ 1.0) Magnetic Nanoparticles Functionalized with Polyacrylic Acid (PAA)
p. 602 abstract
Collective Processes in Thermal Ionization on the Surface of NaAux Intermetallic Compound
p. 616 abstract
The Effect of Chemical–Mechanical Processing of Silicon Wafers on Their Surface Morphology and Strength
p. 626 abstract
Effect of an Electric Double Layer on the Adsorption and Catalytic Properties of the Ytterbium Nanofilm Surface
p. 636 abstract
Comparison of Polarization Fading Compensation Methods for Broadband Microwave Photonic Links by Introduced Noise and Achievable Dynamic Range
p. 643 abstract
The Temperature Distribution Simulation in the Graphene Sublimation Growth Zone on SiC Substrate
p. 648 abstract
Methodological Aspects of Studying the Parameters of Elastic Waves and Controlling the Standard Form of Acoustic Emission in the Field
p. 653 abstract
Kinetics of Photon Radiation Formation during Deformation and Destruction of Compact Bone Tissue
p. 659 abstract
Investigation of Power IR (850 nm) Light-Emitting Diodes Manufacturing by Lift-Off Technique of AlGaAs–GaAs-Heterostructure to Carrier-Substrate
p. 663 abstract
Simulation of Ion Irradiation of Crystalline and Amorphous Targets Tokamak-Reactor First Wall Materials
p. 668 abstract
Influence of the Rate of Directional Crystallization and Silicon Content on the Structure and Strength of the Al–Si–Cu Alloy
p. 675 abstract
Gettering Effect in Cr/4H–SiC UV Photodetectors under Ptoton Irradiation with E = 15 MeV
p. 683 abstract
Record Thick κ(ε)-Ga2O3 Epitaxial Layers Grown on GaN/c-Sapphire
p. 689 abstract
Influence of Modifying Elements on the Structure and Mechanical Properties of Casting Al–Si Alloys
p. 695 abstract
Volatile Products Formed during Electrical Breakdown of Polyethylene Terephthalate and Polypropylene Films in High Vacuum
p. 707 abstract
Analysis of the Effect of Yield Stress on Stress Corrosion Cracking of Martensitic and Ferritic Steels in Acidic Environments
p. 714 abstract
Optical and Electron-Beam Initiation of Porous Silicon Films with Different Contents of Oxidizer and Graphene
p. 721 abstract
Non-stationary Heat Flux Measurement in Shock Tube Experiments Using Sensors Based on Anisotropic Bismuth Thermoelements
p. 727 abstract
Power Source Based on Al0.8Ga0.2As/GaAs Photovoltaic Converter and YPO4:Eu/(238Pu) Radioluminescent Emitter
p. 736 abstract
Influence of the Sign of the Zeta Potential of Nanodiamond Particles on the Morphology of Graphene-detonation Nanodiamond Composites in the form of Suspensions and Aerogels
p. 742 abstract
Effect of Partial Substitution of Iron for Group IV Elements on the Structure and Superconducting Properties of the Fe(Se0.2Te0.8)0.82 Compound
p. 758 abstract
Physical Processes in the Pirani Type Low Vacuum Sensor
p. 766 abstract
Investigation of Concentrator Photovoltaic Modules with Reflective Secondary Optical Elements
p. 771 abstract
Section Methods of X-Ray Diffraction Topography
p. 778 abstract
Investigation of the Surface Temperature in Contact with Plasma by Two-Color Pyrometry
p. 799 abstract
Plasma Electron Temperature Measurement by Foil Soft-X-Ray Spectrometer Installed on TUMAN-3M and Globus-M2 Tokamaks
p. 806 abstract
Limiting Thickness of Pore Walls Formed in Processes of Anode Etching of Heavily Doped Semiconductors
p. 814 abstract