Contents

Technical Physics

Vol. 65, No. 11, 2020

Theoretical and Mathematical Physics

Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography

P. Yu. Glagolev, G. D. Demin, G. I. Oreshkin, N. I. Chkhalo and N. A. Djuzhev p. 1709  abstract

Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles

M. B. Semenov, V. D. Krevchik, D. O. Filatov, A. V. Shorokhov, A. P. Shkurinov, P. V. Krevchik, Y. H. Wang, T. R. Li, A. K. Malik, D. A. Antonov and I. M. Semenov p. 1717  abstract

Atomic and Molecular Physics

Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation

M. M. Barysheva, S. Yu. Zuev, A. Ya. Lopatin, V. I. Luchin, A. E. Pestov, N. N. Salashchenko, N. N. Tsybin and N. I. Chkhalo p. 1726  abstract

Plasma

Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy

S. V. Kuzin, A. A. Reva, S. A. Bogachev, N. F. Erkhova, N. N. Salashchenko, N. I. Chkhalo and V. N. Polkovnikov p. 1736  abstract

Solid State

Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations

V. L. Mironov, E. V. Skorokhodov, D. A. Tatarskiy and I. Yu. Pashen’kin p. 1740  abstract

An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO2(Y) Films

D. O. Filatov, D. A. Antonov, I. N. Antonov, M. A. Ryabova and O. N. Gorshkov p. 1744  abstract

Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire

L. A. Fomin, I. V. Malikov, V. A. Berezin, A. V. Chernykh, A. B. Loginov and B. A. Loginov p. 1748  abstract

Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph

N. A. Djuzhev, E. E. Gusev, A. A. Dedkova, D. A. Tovarnov and M. A. Makhiboroda p. 1755  abstract

Physical Science of Materials

Using Atomic Force Microscopy in the Study of Superprotonic Crystals

R. V. Gainutdinov, A. L. Tolstikhina, E. V. Selezneva and I. P. Makarova p. 1760  abstract

Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures

N. D. Abrosimova, M. N. Drozdov and S. V. Obolensky p. 1767  abstract

Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems

A. Pligovka, P. Yunin, A. Hoha, S. Korolyov, G. Gorokh and E. Skorokhodov p. 1771  abstract

Physics of Nanostructures

The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors

B. A. Gurovich, K. E. Prikhod’ko, B. V. Goncharov, M. M. Dement’eva, L. V. Kutuzov, D. A. Komarov, A. G. Domantovskii, V. L. Stolyarov and E. D. Ol’shanskii p. 1777  abstract

Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam

S. A. Garakhin, M. V. Zorina, S. Yu. Zuev, M. S. Mikhailenko, A. E. Pestov, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko and N. I. Chkhalo p. 1780  abstract

The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range

R. S. Pleshkov, S. Yu. Zuev, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo and P. Jonnard p. 1786  abstract

Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility

S. A. Garakhin, M. M. Barysheva, E. A. Vishnyakov, S. Yu. Zuev, A. S. Kirichenko, S. V. Kuzin, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov and N. I. Chkhalo p. 1792  abstract

The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems

R. M. Smertin, V. N. Polkovnikov, N. N. Salashchenko, N. I. Chkhalo, P. A. Yunin and A. L. Trigub p. 1800  abstract

Multilayer Cr/Sc Mirrors with Improved Reflection for the “Water Transparency Window” Range

V. N. Polkovnikov, S. A. Garakhin, D. S. Kvashennikov, I. V. Malyshev, N. N. Salashchenko, M. V. Svechnikov, R. M. Smertin and N. I. Chkhalo p. 1809  abstract

Photonics

A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range

A. V. Mitrofanov, A. V. Popov and D. V. Prokopovich p. 1814  abstract

Physical Electronics

Deep X-Ray Reflectometry of Supermultiperiod A3B5 Structures with Quantum Wells Grown by Molecular-Beam Epitaxy

L. I. Goray, E. V. Pirogov, M. S. Sobolev, N. K. Polyakov, A. S. Dashkov, M. V. Svechnikov and A. D. Bouravleuv p. 1822  abstract

Material Surface Treatment for Design of Composite Optical Elements

M. V. Zorina, I. I. Kuznetsov, M. S. Mikhaylenko, O. V. Palashov, A. E. Pestov and N. I. Chkhalo p. 1828  abstract

The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy

N. S. Gusev, M. V. Sapozhnikov, O. G. Udalov, I. Yu. Pashen’kin and P. A. Yunin p. 1832  abstract

Ion-Beam Methods for High-Precision Processing of Optical Surfaces

I. G. Zabrodin, M. V. Zorina, I. A. Kas’kov, I. V. Malyshev, M. S. Mikhailenko, A. E. Pestov, N. N. Salashchenko, A. K. Chernyshev and N. I. Chkhalo p. 1837  abstract

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy

I. D. Evsikov, S. V. Mit’ko, P. Yu. Glagolev, N. A. Djuzhev and G. D. Demin p. 1846  abstract

Physics for Sciences of Life

An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy

M. M. Khalisov, V. A. Penniyaynen, S. A. Podzorova, K. I. Timoshchuk, A. V. Ankudinov and B. V. Krylov p. 1853  abstract

Experimental Instruments and Technique

Microwave Volt–Impedance Spectroscopy of Semiconductors

A. N. Reznik, N. V. Vostokov, N. K. Vdovicheva and V. I. Shashkin p. 1859  abstract

Contact Stiffness Measurements with an Atomic Force Microscope

A. V. Ankudinov and M. M. Khalisov p. 1866  abstract

Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method

M. N. Toropov, A. A. Akhsakhalyan, M. V. Zorina, N. N. Salashchenko, N. I. Chkhalo and Yu. M. Tokunov p. 1873  abstract