Contents
Semiconductors
Vol. 39, No. 6, 2005
Simultaneous English language translation of the journal is available from Pleiades Publishing, Inc.
Distributed worldwide by the American Institute of Physics. Semiconductors ISSN 1063-7826.
Atomic Structure and Nonelectronic Properties of Semiconductors
Kinetics of Defect Formation in ZnO Subjected to a Flux of Oxygen Radicals
M. B. Kotlyarevsky, I. V. Rogozin, and A. V. Marakhovskip. 609 abstract
Specific Features of the Segregation-Related Redistribution of Phosphorus during Thermal Oxidation
of Heavily Doped Silicon Layers
O. V. Aleksandrov and N. N. Afonin p. 615 abstract
Thermodynamic Stability and Redistribution of Charges
in Ternary AlGaN, InGaN, and InAlN Alloys
V. G. Debuk and A. V. Vozny
p. 623 abstract
Electronic and Optical Properties of Semiconductors
Determination of the Concentration of Deep Levels in Semi-insulating CdS Single Crystals
by Photoinduced-Current Transient Spectroscopy
A. P. Odrinskip. 629 abstract
Determination of the Charge Carrier Concentration in Lead Selenide Polycrystalline Layers
Using Reflectance Spectra
A. E. Gamarts, Yu. M. Kanageeva, and V. A. Moshnikov p. 636 abstract
Energy Parameters of Two-Electron Tin Centers in PbSe
S. A. Nemov, F. S. Nasredinov, P. P. Seregin, N. P. Seregin, and É. S. Khuzhakulov p. 638 abstract
Dynamic Chaos in a Partially Illuminated Compensated Semiconductor Under the Conditions
of Impurity-Related Breakdown
K. M. Jandieri, Z. S. Kachlishvili, and A. B. Stroganov p. 642 abstract
Modulation of the Characteristics of Intense Picosecond Stimulated Emission from GaAs
N. N. Ageeva, I. L. Bronevo, A. N. Krivonosov, S. E. Kumekov,
T. A. Nalet, and S. V. Stegantsov p. 650 abstract
Recombination Mechanism of the Piezophotoresistive Effect in Compensated Semiconductors
B. M. Pavlyshenko and R. Ya. Shuvar p. 658 abstract
Spontaneous and Stimulated UV Luminescence of ZnO:N at 77 K
A. N. Georgobiani, A. N. Gruzintsev, E. E. Yakimov, C. Barthou, and P. Benalloul p. 661 abstract
Semiconductor Structures, Interfaces, and Surfaces
Increase in the Rate and Discretization of the Kinetics of Isothermal Surface Generation
of Minority Charge Carriers in MetalInsulatorSemiconductor Structures
with a Planar-Inhomogeneous Insulator
A. G. Zhdan, E. I. Goldman, Yu. V. Gulyaev, and G. V. Chucheva p. 666 abstract
ThermalField Forward Current in GaN-Based Surface-Barrier Structures
T. V. Blank, Yu. A. Goldberg, E. E. Zavarin, O. V. Konstantinov, and N. M. Shmidt p. 674 abstract
Low-Dimensional Systems
The Effect of Adsorbed Molecules on the Charge-Carrier Spectrum in a Semiconductor Nanowire
V. A. Lykakh and E. S. Syrkin p. 679 abstract
Local Tunneling Spectroscopy of Silicon Nanostructures
N. T. Bagraev, A. D. Bouravlev, L. E. Klyachkin, A. M. Malyarenko,
W. Gehlhoff, Yu. I. Romanov, and S. A. Rykov p. 685 abstract
Room-Temperature Electroreflectance and Reflectance
of a GaAs/AlGaAs Single Quantum Well Structure
A. A. Herasimovich, S. V. Shokhovets, G. Gobsch, and D. S. Domanevskip. 697 abstract
The Optical Properties of Heterostructures with Quantum-Confined InGaAsN Layers
on a GaAs Substrate and Emitting at 1.31.55 m
N. V. Kryzhanovskaya, A. Yu. Egorov, V. V. Mamutin, N. K. Polyakov, A. F. Tsatsulnikov,
A. R. Kovsh, N. N. Ledentsov, V. M. Ustinov, and D. Bimberg p. 703 abstract
Amorphous, Vitreous, and Porous Semiconductors
Structural Defects and Electrical Conductivity in Nanocrystalline SiC:H Films Doped
with Boron and Grown by Photostimulated Chemical-Vapor Deposition
O. I. Shevaleevskiy, S. Y. Myong, K. S. Lim, S. Miyajima, and M. Konagai p. 709 abstract
Physics of Semiconductor Devices
The Physical Properties of CdTe Doped with V and Ge
S. Yu. Paranchych, L. D. Paranchych, V. N. Makogonenko,
Yu. V. Tanasyuk, M. D. Andrichuk, and V. R. Romanyuk p. 712 abstract
A New Memory Element Based on Silicon Nanoclusters
in a ZrO2 Insulator with a High Permittivity for Electrically Erasable Read-Only Memory
V. A. Gritsenko, K. A. Nasyrov, D. V. Gritsenko, Yu. N. Novikov, A. L. Aseev,
J. H. Lee, J.-W. Lee, and C. W. Kim p. 716 abstract
Special Features of Charge Transport in Schottky Diodes Based on Semi-insulating CdTe
L. A. Kosyachenko, O. L. Maslyanchuk, and V. M. Sklyarchuk p. 722 abstract
A 4H-SiC pin Diode Fabricated by a Combination of Sublimation Epitaxy and CVD
E. V. Bogdanova, A. A. Volkova, A. E. Cherenkov, A. A. Lebedev, R. D. Kakanakov,
L. P. Kolaklieva, G. A. Sarov, T. M. Cholakova, A. V. Kirillov, and L. P. Romanov p. 730 abstract
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