Contents
Semiconductors


Vol. 44, No. 1, 2010

A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Semiconductors ISSN 1063-7826.


Review

Defect Engineering in Implantation Technology
of Silicon Light-Emitting Structures with Dislocation-Related Luminescence

N. A. Sobolev p. 1  abstract


Atomic Structure and Nonelectronic Propertties of Semiconductors

Determination of the Composition of Binary Chalcogenide Glasses
by X-Ray Fluorescence Analysis

G. A. Bordovsky, A. V. Marchenko, P. P. Seregin, N. N. Smirnova, and E. I. Terukov p. 24  abstract


Electrical and Optical Properties of Semiconductors

Spreading Resistance and Compensation of Charge Carriers
in Ferromagnetic Silicon Implanted with Manganese

A. F. Orlov, L. A. Balagurov, I. V. Kulemanov, Yu. N. Parkhomenko,
A. V. Kartavykh, V. V. Saraikin, Yu. A. Agafonov, and V. I. Zinenko
p. 28  abstract

Effect of Growth Temperature on Properties of Transparent Conducting Gallium-Doped ZnO Films

A. Kh. Abduev, A. K. Akhmedov, A. Sh. Asvarov, A. A. Abdullaev, and S. N. Sulyanov p. 32  abstract

Growth of the (In2S3)x(FeIn2S4)1–x Single Crystals and Properties
of Photoelectric Structures on Their Basis

I. V. Bodnar, V. Yu. Rud, Yu. V. Rud, and E. I. Terukov p. 37  abstract

Inherent Potential Inhomogeneity on the Semiconductor Surface
for Equilibrium Impurity Distribution

V. B. Bondarenko, S. N. Davydov, and A. V. Filimonov p. 41  abstract

Discovery of the (In2S3)x(MnIn2S4)1–x Solid Solutions and Fabrication
of Photosensitive Structures Based on Them

V. Yu. Rud, Yu. V. Rud, M. A. Osipova, and I. V. Bodnar p. 45  abstract


Semiconductor Structures, Interfaces, and Surfaces

Dynamics of Photoluminescence and Recombination Processes in Sb-Containing Laser Nanostructures

D. A. Firsov, L. Shterengas, G. Kipshidze, V. L. Zerova, T. Hosoda,
P. Thumrongsilapa, L. E. Vorobjev, and G. Belenky
p. 50  abstract

Monitoring the Composition of the Cd1–zZnzTe Heteroepitaxial Layers
by Spectroscopic Ellipsometry

M. V. Yakushev, V. A. Shvets, I. A. Azarov, S. V. Rykhlytski, Yu. G. Sidorov,
E. V. Spesivtsev, and T. S. Shamirzaev
p.59 abstract


Low-Dimensional Systems

Electroluminescence in p-InAs/AlSb/InAsSb/AlSb/p(n)-GaSb Type II Heterostructures
with Deep Quantum Wells at the Interface

M. P. Mikhailova, E. V. Ivanov, K. D. Moiseev, Yu. P. Yakovlev, E. Hulicius,
A. Hospodkova, J. Pangrac, and T. Simeframe0ek
p. 66  abstract

Formation of Three-Dimensional ZnSe-Based Semiconductor Nanostructures

S. V. Alyshev, A. O. Zabezhaylov, R. A. Mironov, V. I. Kozlovsky, and E. M. Dianov p. 72  abstract


Amorphous, Vitreous, Porous, Organic, and Microcrystalline Semiconductors;
Semiconductor Composites

Charge Carrier Transport in Ge20As20S60 Chalcogenide Semiconductor Films

L. P. Kazakova, K. D. Tsendin, E. A. Lebedev, D. Arsova, and I. A. Obukhova p. 76  abstract

The Nature of Emission of Porous Silicon Produced by Chemical Etching

N. E. Korsunskaya, T. R. Stara, L. Yu. Khomenkova, K. V. Svezhentsova,
N. N. Melnichenko, and F. F. Sizov
p. 79  abstract

Estimation of the Adequacy of the Fractal Model
of the Atomic Structure of Amorphous Silicon

A. B. Golodenko p. 84  abstract

Detection of Singlet Oxygen in Photoexcited Porous Silicon Nanocrystals
by Photoluminescence Measurements

M. B. Gongalsky, E. A. Konstantinova, L. A. Osminkina, and V. Yu. Timoshenko p. 89  abstract


Physics of Semiconductor Devices

Active Region Based on Graded-Gap InGaN/GaN Superlattices
for High-Power 440- to 470-nm Light-Emitting Diodes

A. F. Tsatsulnikov, W. V. Lundin, A. V. Sakharov, E. E. Zavarin, S. O. Usov,
A. E. Nikolaev
, N. A. Cherkashin, B. Ya. Ber, D. Yu. Kazantsev, M. N. Mizerov,
Hee Seok Park, M. Hytch, and F. Hue
p. 93  abstract

Paradoxes of Photoconductive Target and Optical Control of Secondary Ion Yield

A. G. Rokakh and M. D. Matasov p. 98  abstract

Efficient Infrared–Terahertz Pulse Conversion in Waveguide Semiconductor Structures

V. A. Kukushkin p. 106  abstract


Fabrication, Treatment, and Testing of Materials and Structures

The Initial Stage of Growth of Crystalline Nanowhiskers

N. V. Sibirev, M. B. Nazarenko, G. E. Cirlin, Yu. B. Samsonenko, and V. G. Dubrovskii p. 112  abstract

The Role of Stress Distribution at the Film/Barrier Interface in Formation of Copper Silicides

A. V. Panin, A. R. Shugurov, I. V. Ivonin, and Ye. V. Shesterikov p. 116  abstract

Effect of Pressure in the Growth Reactor on the Properties
of the Active Region in the InGaN/GaN Light-Emitting Diodes

W. V. Lundin, E. E. Zavarin, M. A. Sinitsyn, A. V. Sakharov, S. O. Usov,
A. E. Nikolaev, D. V. Davydov, N. A. Cherkashin, and A. F. Tsatsulnikov
p. 123  abstract

Monte Carlo Simulation of Growth of Nanowhiskers

A. G. Nastovjak, I. G. Neizvestny, I. L. Shwartz, and Z. Sh. Yanovitskaya p. 127  abstract


In Memoriam

To the Memory of Mikhail Grigor’evich Mil’vidskii (1932–2009) p. 133


Rules for the Authors p.134


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