Contents

Semiconductors


Vol. 55, No. 13, 2021

A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Semiconductors ISSN 1063-7826.


Basic Research

Method for Predicting the Effective Conductivity of Textured Polycrystals Taking Intergranular Gaps into Consideration

I. V. Lavrov p. 1003  abstract

Spin Valves in Microelectronics (A Review)

Iu. A. Iusipova and A. I. Popov p. 1008  abstract


Electronics Materials

Prediction of the Effective Permittivity of Foam Polymer Materials

I. V. Lavrov, V. V. Bardushkin, V. B. Yakovlev and A. V. Bardushkin p. 1021  abstract

Effect of Fullerene Encapsulation on Optical and Thermoelectrical Properties of Carbon Nanotubes

E. V. Morozova and D. A. Timkaeva p. 1024  abstract

Prediction of Conditions for Chloride–Hydride Epitaxy of Ga1 – yInyAs1 – xPx Layers Isoperiodic with GaAs and GaAs1 – xPx

E. N. Vigdorovich p. 1029  abstract

Electron-Microscopy Studies of the Structure of Thin Epitaxial Ge2Sb2Te5 Layers Grown on Si(111) Substrates

Yu. S. Zaytseva, N. I. Borgardt, A. S. Prikhodko, E. Zallo and R. Calarco p. 1033  abstract


Elements of Integrated Electronics

Normally-Off p-Gate Transistor Based on AlGaN/GaN Heterostructures

V. I. Egorkin, V. A. Bespalov, A. A. Zaitsev, V. E. Zemlyakov, V. V. Kapaev and O. B. Kukhtyaeva p. 1039  abstract

Analysis of Degradation Mechanisms of Gate Dielectrics Based on SiO2 in MOS Transistors

D. A. Eliseeva and S. O. Safonov p. 1045  abstract

Investigation of the Dynamic Range of Silicon Photomultiplier Tubes

A. O. Zenevich and O. V. Kochergina p. 1049  abstract


Technological Processes and Routes

Analysis of the Gas Phase Epitaxy of Silicon Carbide as a Basic Process for the Technology of Power Electronics

A. V. Afanasev, V. A. Ilyin, V. V. Luchinin and S. A. Reshanov p. 1055  abstract


Micro- and Nanosystem Technology

Study of the Sensitivity of Porous SnO2-Based Thick-Film Elements to the Hydrogen Concentration in Air

V. V. Amelichev, S. S. Generalov, A. V. Nikolaeva, S. A. Polomoshnov, V. A. Kovalev, A. M. Kovalev and V. V. Krivetskiy p. 1063  abstract