Contents
Semiconductors
Vol. 45, No. 13, 2011
A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Semiconductors ISSN 1063-7826.
Basic Research
Effective Conductivity of a Polycrystalline Medium. Uniaxial Texture and Biaxial Crystallites
I. V. Lavrov p. 1621 abstract
Determination of the Absorption and Scattering Coefficients of Highly Scattering Media
from the Experimentally Established Temporal Distributions of Laser Pulse Intensities
A. A. Danilov, S. A. Tereshchenko, I. V. Pyanov, and A. I. Gavrikov p. 1628 abstract
Model of Nonequilibrium Crystallization for the Numerical Solution
to the Problem of Semiconductor Crystal Growth from Melts
V. A. Goncharov, I. V. Azanova, and B. V. Vasekin p. 1632 abstract
Electron Transport Simulation in Resonant-Tunneling GaN/AlGaN Heterostructures
V. I. Egorkin, M. N. Zhuravlev, and V. V. Kapaev p. 1638 abstract
Materials for Electronic Engineering
Crystallophysical Properties of the In1yGayAs1xNx/GaAs Heterostructures
E. N. Vigdorovich p. 1642 abstract
Method of Vacuum Deposition for the Formation of Secondary-Emission Alloy Coatings
V. F. Anisimov and A. S. Arefev p. 1646 abstract
Silicon-Ingot Quality Monitoring by the Photoconductivity-Decay Method
A. F. Yaremchuk p. 1649 abstract
Microelectronics Technology
Specific Features of the Morphology of Titanium Oxide Films Prepared
by Pulling Silicon Substrates from a Solution
A. N. Belov, I. M. Gavrilin, S. A. Gavrilov, and A. A. Dronov p. 1653 abstract
Formation of Graphene Layers by Vacuum Sublimation
of Silicon Carbide Using a Scanning Heat Source
A. N. Dmitriev and D. I. Cherednichenko p. 1656 abstract
Microelectronic Devices and Systems
Ultrawide-Band Gigahertz-Range Transceiver Based on SiGe Transistors
V. P. Timoshenkov p. 1661 abstract
Probability Characteristics of Electrical Noise in Heterojunction Light-Emitting Diodes
V. A. Sergeev, I. V. Frolov, A. A. Shirokov, and Yu. N. Shcherbatyuk p. 1670 abstract
A Multichannel Photoelectric Detector of Emission Spectra
A. N. Kolerov, D. V. Onishchenko, and D. S. Rukhlov p. 1676 abstract
Integrated Circuit for Processing a Low-Frequency Signal from a Seismic Detector
N. I. Malashevich, A. S. Roslyakov, S. A. Polomoshnov, and R. A. Fedorov p. 1680 abstract
Multichannel Photocells for Image Converters with Color Separation
E. A. Denisova, V. V. Uzdovskii, and V. I. Khainovskii p.1684 abstract
Nanotechnology
Fluctuation Phenomena in Nanoscale Nickel Films Near the Melting Point
D. G. Gromov, G. P. Zhigalskii, A. V. Karev, I. A. Karev, I. S. Chulkov, and S. S. Shmelev p. 1689 abstract
Measurement of the Parameters of Nanometer Films by Optical and Microwave Methods
D. A. Usanov, Al. V. Skripal, An. V. Skripal, A. V. Abramov,
A. S. Bogolyubov, and Ali Bakouei p. 1694 abstract
Two-Dimensional Defects and the Problem of the Identification
of a Nanoscale Particle Structure
K. S. Maksimov p. 1699 abstract
Low-Temperature Process of the Formation of Tubular and Graphene Carbon Structures
S. V. Dubkov, S. A. Gavrilov, D. G. Gromov, and G. A. Krasulin p. 1705 abstract
Formation of Nanosize Structures on a Silicon Substrate by Method of Focused Ion Beams
O. A. Ageev, A. S. Kolomiytsev, and B. G. Konoplev p. 1709 abstract
Nanocomposite Solder for Laser Welding of Biological Tissues
A. Yu. Gerasimenko, O. V. Gubarkov, L. P. Ichkitidze, V. M. Podgaetskii,
S. V. Selishchev, and O. V. Ponomareva p. 1713 abstract
Measurement Techniques
Reducing the Temperature-Drift Effect in Scanning Probe Microscopes
V. A. Bykov, E. V. Kuznetsov, and E. S. Pyankov p. 1719 abstract
Author Index to Volume 45, 2011
p.1723
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