Vol. 62, No. 5, 2019
A Gas Target for 82Sr Production Using the 80Kr(4He, 2n)82Sr Reaction at the U-150 Cyclotron of the Kurchatov Institute NRC
p. 595 abstract
The Coherent Particle-Oscillation Excitation System at the VEPP-4M Collider
p. 599 abstract
A Secondary Ion Energy Analyzer for Measuring the Degree of Compensation of the Ion Beam Space Charge
p. 609 abstract
Reconstruction of Tracks in a Detector on Drift Tubes and Chambers of the Modified FODS Spectrometer on the U-70 Accelerator Complex
p. 615 abstract
Determination of Charged-Particle Momenta According to a Decision Table with a Polynomial Approximation at the FODS Spectrometer
p. 626 abstract
A Broadband Spectral Analyzer of Cosmic Radio Emissions
p. 633 abstract
A High-Voltage Power Supply for a Microfocus X-Ray Tube
p. 640 abstract
A Magnetic-Field Regulation and Stabilization System
p. 646 abstract
A Gas-Dynamic Interface of the Sandwich Type for Measuring the Elemental Composition of a Sample Using the ERIAD Method (Electrospray with In-source Atomization)
p. 653 abstract
The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation
p. 659 abstract
Application of Dozimetric Glasses to Measure the Fluence of Fast Electrons in Laser Experiments
p. 664 abstract
An Automated Setup for Measuring the Light-Scattering Characteristics of Samples with Rough Surfaces at Laser Wavelengths in the Range of 0.35–1.1 μm
p. 669 abstract
A Technique for Wavelength Calibration of a Multichannel Polychromator Spectrometer Using the Fabry–Perot Etalon
p. 675 abstract
A Multirange Photodetector Based on the Effect of Photon Dragging Current Carriers in Germanium for High-Power Lasers in the Infrared Range
p. 679 abstract
The PIPLS-B Mass Analyzer of Solar Wind Ions for the Interheliosond Project
p. 683 abstract
A Magnetic Scanner for High-Energy Beams of Heavy Ions
p. 686 abstract
An Infrasonic Hydrophone
p. 691 abstract
A Portable Spectral Absorption Meter for Optical Radiation from Liquids
p. 694 abstract
A Method of Operational Control of the Homogeneity of the Distribution of the Electrical Properties of Semiconductor Materials
p. 698 abstract
Control of the Profile and Curvature of the Surface of Single-Crystal Plates of X-Ray Optical Elements Using Piezoelectric Bimorphs
p. 703 abstract
A Small Laboratory Hydraulic Press with a Force of 20 tons
p. 708 abstract
An Installation for Compressing Gases
p. 710 abstract
A Surface Preparation Machine for Cylindrical Mechanical Test Specimens
p. 712 abstract
Determination of the Lower Eigenfrequency of Vibrations of a Piezoelectric Accelerometer
p. 718 abstract
The Method of Hysteresis Properties Measurement for Magnetic Microwires under Stretching in Situ
p. 723 abstract
A Laboratory Apparatus for Spark Plasma Sintering of Ceramic and Composite Materials
p. 726 abstract