Vol. 53, No. 14, 2017
A simultaneous English language translation of this journal is available from Pleiades Publishing, Ltd.
Distributed worldwide by Springer. Inorganic Materials ISSN 0020-1685.
Detection of Sodium in Highly Pure Graphite via High-Resolution Electrothermal Atomic Absorption Spectrometry with a Continuous Spectrum Source
p. 1379 abstract
Time-Efficient LC/MS/MS Determination of Low Concentrations of Methylphosphonic Acid
p. 1382 abstract
Highly Sensitive Chromatography Mass Spectrometry Determination of Impurities in High-Purity Monogermane Using Adsorption Capillary Column with Carbon Sorbent
p. 1386 abstract
Advanced Techniques for Sample Processing of the Reusable Metal-Containing Raw Material (Review)
p. 1391 abstract
Determination of the Mode of Occurrence of V, Fe, and Mn in Slags and Charge of Vanadium Production by X-Ray Spectroscopy
p. 1399 abstract
Determination of Main Components of Glass-Forming Cu–Zr Alloys
p. 1405 abstract
Combined Methods of Analysis of Metal-Containing Raw Material (Review)
p. 1411 abstract
Rhodium Determination in Environmental Objects by the Catalytic Method according to the Reaction of Sulfarsazen Oxidation with Periodate
p. 1418 abstract
Application of Microwave Plasma Atomic Emission Spectrometry and Hydride Generation for Determination of Arsenic and Selenium in Mineral Water
p. 1422 abstract
Voltammetric Determination of Carmoisine in Soft Drinks
p. 1427 abstract
Stable Highly Enriched Isotopes in Routine Analysis of Rocks, Soils, Grounds, and Sediments by ICP-MS
p. 1432 abstract
Specific Features of Application of Different Methods of Analytical Control of Spent Catalysts of the Petrochemical Industry
p. 1442 abstract
Determination of Microelements in Oil by Combined Sample Preparation Technique
p. 1448 abstract
Analysis of the Samples with an Unknown Matrix Using Data Mining Algorithms
p. 1454 abstract
Synthesis of ZnO Thin Films Doped with Ga and In: Determination of Their Composition through X-Ray Spectroscopy and Inductively Coupled Plasma Mass Spectrometry
p. 1458 abstract
Evaluation of the Component of Bias of X-Ray Microanalysis Related to Surface Relief of the Specimen
p. 1463 abstract