Vol. 66, No. 4, 2021

Crystallography Reports

Column

Editor-in-Chief’s Column

Reviews

Ultrafast Electron Microscopy: An Instrument of the XXI Century

S. A. Aseev, B. N. Mironov, E. A. Ryabov, A. S. Avilov, G. V. Girichev and A. A. Ischenko p. 553 abstract

In Situ Reflection Electron Microscopy for the Analysis of Silicon Surface Processes: Sublimation, Electromigration, and Adsorption of Impurity Atoms

D. I. Rogilo, S. V. Sitnikov, E. E. Rodyakina, A. S. Petrov, S. A. Ponomarev, D. V. Sheglov, L. I. Fedina and A. V. Latyshev p. 570 abstract

Study of Wide-Gap Semiconductors Using Electron-Beam Induced Current Method

E. B. Yakimov p. 581 abstract

Diffraction and Scattering of Ionizing Radiations

Method of Contrast Enhancement and Background Correction in Electron Diffraction Patterns of Polycrystalline Materials

V. I. Bondarenko and E. I. Suvorova p. 594 abstract

Crystal Growth

Specific Features of the Atomic Structure of Iron Silicide Nanocrystals in a Silicon Matrix

A. K. Gutakovskii and A. V. Latyshev p. 601 abstract

Nanomaterials and Ceramics

The Electron Diffraction Investigation of the Phase Structures in the Systems MF₂–RF₃ (CaF₂–ErF₃, SrF₂–LaF₃)

V. I. Nikolaychik, A. S. Avilov and B. P. Sobolev p. 608 abstract

Microstructure and Rheological Behavior of Stabilized Gold Nanoparticles Hydrosol

R. A. Kamyshinsky, N. M. Kuznetsov, P. V. Lebedev-Stepanov, A. S. Stepko, S. N. Chvalun and A. L. Vasiliev p. 612 abstract

Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials

E. A. Lukina, A. I. Gulyaev, P. L. Zhuravleva and D. V. Zaitsev p. 618 abstract

Physical Properties of Crystals

Extended Defects in O⁺-Implanted Si Layers and Their Luminescence

V. I. Vdovin, L. I. Fedina, A. K. Gutakovskii, A. E. Kalyadin, E. I. Shek, K. F. Shtel’makh and N. A. Sobolev p. 625 abstract

Structural Transformations of the Dislocation Cores in Si and Their Relationship with Photoluminescence

L. I. Fedina, A. K. Gutakovskii, V. I. Vdovin and T. S. Shamirzaev p. 636 abstract

Real Structure of Crystals

Anomalously Large Burgers Vectors of Screw Dislocations in Gallium Nitride Nanowires

D. A. Kirilenko and K. P. Kotlyar p. 644 abstract

Electron Microscopy in the Study of Lunar Regolith

A. V. Mokhov, P. M. Kartashov, T. A. Gornostaeva, A. P. Rybchuk and O. A. Bogatikov p. 648 abstract

Structure of Inorganic Compounds

Application of Electron Energy-Loss Spectroscopy for Analysis of the Microstructure of Reactor Materials

K. E. Prikhod’ko and M. M. Dement’eva p. 656 abstract

Electron Microscopy and Electron Diffraction Studies of Morphology and Crystal Structure of Natural Silicas

V. Ya. Shklover, P. R. Kazanskii, N. A. Artemov, and I. G. Maryasev p. 663 abstract

Metamaterials and Photonic Crystals

Microscopic Studies of Alignment Layers Processed by a Focused Ion Beam for the Creation of Liquid Crystal Metasurfaces

V. V. Artemov, D. N. Khmelinin, A. V. Mamonova, M. V. Gorkunov and A. A. Ezhov p. 673 abstract

Surface and Thin Films

Microstructure of Epitaxial GaN Layers Synthesized on Nanoprofiled Si(001) Substrates

A. V. Myasoedov, N. A. Bert and V. N. Bessolov p. 682 abstract

Electron Microscopy Study of Surface Islands in Epitaxial Ge₃Sb₂Te₆ Layer Grown on a Silicon Substrate

Yu. S. Zaytseva, N. I. Borgardt, A. S. Prikhodko, E. Zallo and R. Calarko p. 687 abstract

Technique for Determining the Fracture Relief Periodicity in Fractured Materials

M. A. Artamonov p. 694 abstract

Microstructural Features of Poly(N-Vinylpyrrolidone)−La(NO₃)₃ ⋅ 6H₂O Hydrogel

A. S. Orekhov, N. A. Arkharova and V. V. Klechkovskaya p. 699 abstract

Apparatus

Application of the EBSD Method to Study the Fracture Mechanisms of Reactor Pressure Vessels Steels under Operational Factors

D. A. Maltsev, E. A. Kuleshova, S. V. Fedotova, M. A. Saltykov and N. V. Stepanov p. 704 abstract

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