Optical Properties of BiFeO₃ Epitaxial Thin Films

V. B. Shirokov^{a, b}*, Yu. I. Golovko^a, and V. M. Mukhortov^{a, b}

^a Southern Scientific Center, Russian Academy of Sciences, pr. Chekhova 41, Rostov-on-Don, 344006 Russia
^b Southern Federal University, Bol’shaya Sadovaya ul. 105/42, Rostov-on-Don, 344006 Russia
*e-mail: shirokov-vb@rambler.ru

Received December 13, 2012

Abstract—The properties of neodymium-doped BiFeO₃ nanosized films on magnesium oxide single-crystal
substrates are studied. The films are obtained using high-frequency sputtering with the aid of layered growth.
The structural perfection of the films is analyzed using the X-ray diffraction. The transmission of the films with
different thicknesses is studied in the wavelength interval 200–1100 nm. The spectra are processed with the aid
of a dispersion formula for permittivity of a sum of oscillators with allowance for damping, so that direct and
indirect transitions can be revealed. The absorption edges are estimated to be 2.81 and 2.78 eV for the direct
transitions of the films with thicknesses of 14 and 60 nm, respectively.

DOI: 10.1134/S1063784214010174

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