Separation and Preconcentration of Impurities in Rare-Earth-Based Materials for Spectrometric Methods

K. V. Petrovaa, *, V. V. Es’kinab, V. B. Baranovskayaa, M. S. Doroninaa, N. A. Korotkovaa, and A. A. Arkhipenkoa

a Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Moscow, 119991 Russia

b State Research and Design Institute of Rare Metal Industry Giredmet, Moscow, 111524 Russia

Correspondence to: *e-mail: gkv007@mail.ru

Received 17 February, 2022

Abstract—The efficiency of using rare earth metals largely depends on their impurity composition, which affects the structure and properties of materials. Before the analytical control of materials based on rare earth elements (REEs) and the starting materials for their production, the task is to determine both macrocomponents with high accuracy and impurities with high sensitivity, correctness, and precision. To determine the impurities in REE-based materials in the range from 10–5 to 5.0 wt %, a complex of methods of atomic emission and mass spectral analysis is frequently used. However, the analysis of REE-based materials, even using these modern highly sensitive methods, is a difficult task due to spectral and matrix interferences. Therefore, different separation/preconcentration procedures are needed to determine both rare earth and non-rare-earth impurities. This article reviews publications of preconcentration methods for spectral and mass spectral methods of analysis of materials based on REEs and some other analytical methods. It is shown that the most common approaches are liquid extraction and chromatography. Sorption, cloud-point extraction, and precipitation are also used. There is no universal approach. Each method discussed in this article has its advantages and limitations. The analytical completion of the method confirms the effectiveness of the selected separation/preconcentration method in each specific case.

Keywords: rare earth elements, separation, preconcentration, spectral analysis, inductively coupled plasma mass spectrometry (ICP-MS), inductively coupled plasma atomic emission spectrometry (ICP-AES)

DOI: 10.3103/S106782122205008X