Detection of Recrystallized Structure by Means of Automatic
Analysis of Electron Backscattered Diffraction Patterns

T. N. Konkova^a, S. Yu. Mironov^{a, b}, A. V. Korznikov^a, and M. M. Myshlyaev^{c, d}

^a Institute for Metals Superplasticity Problems, Russian Academy of Sciences,
ul. Khalturina 39, Ufa, 450001 Bashkortostan, Russia

* e-mail: konkova_05@mail.ru

^b Department of Materials Processing, Graduate School of Engineering, Tohoku University,
Aramaki-aza-Aoba 02, Aoba-ku, Sendai, Miyagi, 980-8579 Japan

^c Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences,
Leninskii pr. 49, Moscow, 119991 Russia

^d Institute of Solid State Physics, Russian Academy of Sciences,
ul. Akademika Ossipyana 2, Chernogolovka, Moscow oblast, 142432 Russia

Received July 19, 2011; in final form, September 6, 2011

Abstract—The possibility of applying the automatic analysis of electron backscattered diffraction (EBSD) pat-
terns to reveal the recrystallized structure in the partially recrystallized material has been discussed. The anal-
ysis has been performed based on new experimental results. It has been shown that the EBSD method can be
successfully used to investigate the recrystallization process.

DOI: 10.1134/S1063783412040130

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