The Effect of the Interface Width on the Exchange Interaction Constant between Ferro- and Antiferromagnets

L. L. Afremova, *, L. O. Brykinb, and I. G. Il’yushina

a Department of Theoretical Physics and Intelligent Technologies, Institute of High Technologies and Advanced Materials, Far Eastern Federal University, Vladivostok, Primorskii Krai, 690922 Russia

b Laboratory for Simulation of Physical Processes, Institute of High Technologies and Advanced Materials, Far Eastern Federal University, Vladivostok, Primorskii Krai, 690922 Russia

Correspondence to: *e-mail: afremov.ll@dvfu.ru

Received 3 October, 2022

Abstract—In the approximation of the average spin method, a system of equations for determining the average magnetic moments of atoms at the interface between a ferromagnet and an antiferromagnet is formulated. It is possible to simulate the dependences of interfacial exchange interaction constant Ain on the temperature, antiferromagnetic layer thickness, and interface width by solving the system of equations for an ultrathin Ni/NiO film. It is found that the interfacial exchange interaction constant in a film with a fixed interface width at low temperatures increases with an increase in the thickness of the antiferromagnetic layer. With an increase in the interface width, the Ain value decreases by a factor of 1.3 and reaches its minimum level.

Keywords: average spin method, ultrathin films, interfacial exchange interaction

DOI: 10.1134/S0031918X22601767