Effect of Annealing on X-ray Luminescence
of Cerium-doped Fluorohafnate Glasses

S. Kh. Batygov, N. N. Vinogradova, V. V. Voronov, and L. N. Dmitruk

Institute of General Physics, Russian Academy of Sciences, ul. Vavilova 38, Moscow, 117334 Russia

Received May 27, 1997

Abstract—The effect of annealing on X-ray luminescence of glasses in the HfF₄–BaF₂–AlF₃–NaF–InF₃–CeF₃
system is studied. It is established that the annealing at temperatures 30–40 K above the glass transition point
results in a certain increase in the luminescence intensity without deterioration of the optical quality of glasses.
The heat treatment at higher temperatures is accompanied by a pronounced crystallization of glasses and brings
about a multifold increase in the X-ray luminescence intensity. X-ray luminescence investigations are carried
out with different polycrystalline compounds, which can crystallize in the studied fluorohafnate glasses. It is
found that the CeHf₂F₁₁ and CeHfF₇ compounds characterized by a comparatively high luminescence yield
(higher than that for CeF₃) crystallize in the HfF₄–CeF₃ binary system. These compounds can be responsible
for an increase in the X-ray luminescence intensity upon annealing of glasses.

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