Spectrophotometric Differential Kinetic Method
for the Determination of Germanium
and Silicon in the Presence of Each Other
in the GeO₂SiO₂ Systems

V. A. Bayanov^a, O. V. Rakhimova^a, V. I. Rakhimov^b, and M. P. Syomov^b

^aUl’yanov-Lenin LETI St. Petersburg State Electrotechnical University, ul. prof. Popova 5, St. Petersburg, 197376 Russia

^bInstitute of Chemistry, St. Petersburg State University, Universitetskii pr. 26, Petrodvorets, St. Petersburg, 198504 Russia

e-mail: mad.scientist@rambler.ru

Received February 24, 2015

Abstract—The spectrophotometric differential kinetic method of determination of silicon and germanium
based on a difference in the kinetic parameters in the presence of each other the same analytical form in GeO₂–
SiO₂ systems is described. The possibility of the development of analytical techniques taking into account the
revealed limitations of the proposed kinetic scheme is shown. The studies of the model solutions show that the
margin of analytical error does not exceed the acceptable limit for the applied method.

Keywords: sol-gel techniques, fiber optics, kinetic spectrophotometry, heteropolyanions

DOI: 10.1134/S1087659616020036

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