aLaboratory of Semiconductor Oxide Materials, Moscow Institute of Physics and Technology, Dolgoprudny, Russia
bInstitute of Chemistry, St. Petersburg State University, St. Petersburg, Russia
cResearch Institute of the Tajik National University, Dushanbe, Tajikistan
dSouth Ural State University, Chelyabinsk, Russia
email: *vinnikda@susu.ru
DOI: 10.1134/S0022476625020180