Near-Electrode Processes
in Lanthanumframe0Gallium Tantalate Crystals

O. A. Buzanova, E. V. Zabelinab, N. S. Kozlovab, and T. B. Sagalovab

a OAO Fomos Materials, ul. Buzheninova 16, Moscow, 119049 Russia

b Moscow State Institute of Steel and Alloys, Leninskiframe1 pr. 4, Moscow, 119049 Russia

e-mail: e.zabelina@gmail.com; kozlova_nina@mail.ru

Received March 21, 2008

Abstract—The near-electrode processes on the surfaces of the polar cuts of lanthanum–gallium tantalate crys-
tals grown in different atmospheres were investigated. The temperature dependences of short-circuit currents
in the temperature range 20–700°C were measured and phase analysis of the sample surfaces after the temper-
ature tests were performed. It is shown that short-circuit currents arise on the surfaces of polar cuts with iden-
tical conducting coatings without preliminary polarization. These currents are caused by the generation of
intrinsic emf as a result of the electrochemical reactions on opposite polar cut surfaces coming in contact with
a conducting coating. It is established that the crystal growth atmosphere and the conducting coating material
significantly affect the temperature dependences of short-circuit currents.

PACS numbers: 77.84.Bw, 82.45.Un

DOI: 10.1134/S1063774508050210


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