Isoelectric Point of Silicon Oxide Particles
Coated by Monolayers of Oxides of Titanium and Aluminum

L. E. Ermakova, M. P. Sidorova, and V. M. Smirnov

Research Institute of Chemistry, St. Petersburg State University (Petrodvorets Branch),
Universitetskii pr. 2, Petrodvorets, Russia 198904

Received June 3, 1996

Abstract—The ultramicroelectrophoresis method was applied to investigate the effect of the number of mono
layers of titanium and aluminum oxides deposited onto the SiO₂ particles (A-175 aerosil) on the position of the
isoelectric point of samples.

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